CS5920 datasheet(14/160 Pages) AMCC

14 / 160 page

S5920 – PCI Product

Revision 1.01 – November 28, 2005

AMCC Confidential and Proprietary

DS1596

Data Book

PRODUCT QUALIFICATIONS

A qualification is a sequence of tests in which all

parameters, including the reliability of the device are

tested. It is this sequence of tests which initially qual-

ifies the part to be released for production.

Thorough reliability testing is performed on new prod-

uct and package families in order to ensure the

expectations of our customers are met. These tests

include environmental, mechanical and life testing per-

formed in accordance with Military Standards,

industrial accepted methods and AMCC Test Proce-

dures. Contact the factory for specific details regarding

your selected product/package combination.

AMCC provides MIL-STD-883 Methods 5005 and

5010 testing for our military customers on contract as

well as MIL-H-38534 quality conformance screening

for hybrid customers.

MIL-STD-883 Method 5005

“Qualification And Quality Conformance Proce-

dures”

Method 5005 establishes qualification and quality-con-

formance inspection procedures for semi-conductors

to ensure that the quality of devices and lot conform

with the requirements of the applicable procurement

document. The full requirements of Group A, B, C, D,

and E test and inspections are intended for use in ini-

tial device qualification—or requalification in the event

of product or process change—and in periodic testing

for retaining qualification.

Group A consists of electrical tests performed on an

inspection lot which has already passed the 100%

screening requirements. After a lot has passed the

100% screen tests, a random sample of parts is

selected from the total population of devices to form

the inspection lot. The inspection lot is then subjected

to these Group A electrical tests.

Group B inspection tests are used to monitor the fabri-

cation and assembly processes performed on each

inspection lot.

Group C consists of a 1000-hour life test conducted to

verify die integrity.

Group D verifies the material integrity and the reliabil-

ity of the package.

Group E demonstrates the radiation hardness capa-

bility of the device. Performed on a generic basis by

device type or as required for an application.

MIL-STD-883 Method 5010

“Test Procedures For Custom Monolithic Microcir-

cuits”

This method establishes screening and quality con-

formance procedures for the testing of custom and

semicustom monolithic semiconductors to verify Class

B or Class S quality and reliability levels. Testing is

performed in conjunction with other documentation

such as MIL-I-38535 and an applicable detail

specification.

It establishes the design, material, performance, con-

trol, and documentation requirements needed to

achieve prescribed levels of device quality and reliabil-

ity. AMCC can support qualification using this method.

Until August of 1983, the qualification most commonly

used was Method 5005. Since that time, the newer

revision of MIL-STD-883 includes Method 5010, which

is better suited for semicustom devices (logic arrays

included). Either qualification is adequate, but it is

desirable to use the 5010 qualification procedure in

qualifying custom or semicustom devices.

Qualification Method 5005 VS. 5010

The primary difference between the two methods is in

the Group D test. Method 5005 uses electrically-good

devices, where method 5010 uses electrical rejects

and package-only parts for environmental tests. In

addition, Method 5010 is designed for smaller produc-

tion releases (i.e., 2000 devices/year) while Method

5005 is designed for large production releases.

Generic Data

Under the provision of MIL-I-38535, a customer can

elect to qualify using generic data (similar device/fam-

ily). However, the provisions of the applicable contract

should be reviewed. In most cases generic data will

satisfy full qualification requirements.

Since many of the qualifications at AMCC are ongoing,

generic data may be available for this purpose.

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