Analog Integrated Circuit Device Data

16

Freescale Semiconductor

33689

ELECTRICAL CHARACTERISTICS

TIMING DIAGRAMS

TIMING DIAGRAMS

Figure 5. Test Circuit for Timing Measurements

Figure 6. SPI Timing Characteristics

TXD

RXD

33689

VS1/VS2

LIN

R0

C0

R0/C0 Combinations:

1.0 k

Ω/1.0 nF

660

Ω/6.8 nF

500

Ω/10 nF

GND

TGND AGND

DI 0

DO 0

Undefined

Don’t Care

DI 7

Don’t Care

DO 7

CS

SCLK

MOSI

MISO

Note Incoming data at MOSI pin is sampled by the 33689 at SCLK falling edge. Outgoing data at MISO is set by the 33689