PM5366-PI datasheet(211/267 Pages) PMC

211 / 267 page

PRELIMINARY

PM5366 TEMAP-84

DATASHEET

PMC-2010672

ISSUE 1

HIGH DENSITY 84/63 CHANNEL VT/TU MAPPER

AND M13 MULTIPLEXER

PROPRIETARY AND CONFIDENTIAL

199

Test-Logic-Reset

The test logic reset state is used to disable the TAP logic when the device is in

normal mode operation. The state is entered asynchronously by asserting input,

TRSTB. The state is entered synchronously regardless of the current TAP

controller state by forcing input, TMS high for 5 TCK clock cycles. While in this

state, the instruction register is set to the IDCODE instruction.

Run-Test-Idle

The run test/idle state is used to execute tests.

Capture-DR

The capture data register state is used to load parallel data into the test data

registers selected by the current instruction. If the selected register does not

allow parallel loads or no loading is required by the current instruction, the test

Shift-DR

The shift data register state is used to shift the selected test data registers by

one stage. Shifting is from MSB to LSB and occurs on the rising edge of TCK.

Update-DR

The update data register state is used to load a test register's parallel output

latch. In general, the output latches are used to control the device. For

example, for the EXTEST instruction, the boundary scan test register's parallel

output latches are used to control the device's outputs. The parallel output

latches are updated on the falling edge of TCK.

Capture-IR

The capture instruction register state is used to load the instruction register with

a fixed instruction. The load occurs on the rising edge of TCK.

Shift-IR

The shift instruction register state is used to shift both the instruction register and

the selected test data registers by one stage. Shifting is from MSB to LSB and

occurs on the rising edge of TCK.

PM5366-PI Datasheet(PDF) 211 Page - PMC-Sierra, Inc