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APPLICATIONS

DESCRIPTION

_

+

THS4303

Rf

49.9

Ω

VI

+

22

µF

47 pF

0.1

µF

VS+

50

Ω Source

Rg

VO

+

22

µF

47 pF

0.1

µF

VS−

30.1

Ω

30.1

Ω

FB

FB

FB = Ferrite Bead

10

12

14

16

18

20

22

100 k

1 M

10 M

100 M

1 G

10 G

f − Frequency − Hz

SMALL SIGNAL FREQUENCY RESPONSE

RL = 100 Ω

VO = 100 mVPP

VS = 5 V

49.9

Ω

50

Ω Load

THS4303

SLOS421B – NOVEMBER 2003 – REVISED JANUARY 2005

WIDEBAND FIXED-GAIN AMPLIFIER

•

Wideband Signal Processing

•

Fixed Closed-Loop Gain Amplifier

•

Wireless Transceivers

– 10 V/V (20 dB)

•

IF Amplifier

•

Wide Bandwidth: 1.8 GHz

•

ADC Preamplifier

•

High Slew Rate: 5500 V/µs

•

DAC Output Buffers

•

Low Total Input Referred Noise: 2.5 nV/

√Hz

•

Test, Measurement, and Instrumentation

•

Low Distortion

•

Medical and Industrial Imaging

– HD2: –65 dBc at 70 MHz

– HD3: –76 dBc at 70 MHz

– IMD3: –85 dBc at 100 MHz

The THS4303 device is a wideband, fixed-gain ampli-

– OIP3: 34 dBm at 100 MHz

fier that offers high bandwidth, high slew rate, low

noise, and low distortion. This combination of specifi-

– IMD3: –70 dBc at 300 MHz

cations enables analog designers to transcend cur-

– OIP3: 27 dBm at 300 MHz

rent performance limitations and process analog sig-

•

High Output Drive:

±180 mA

nals at much higher speeds than previously possible

with closed-loop, complementary amplifier designs.

•

Power Supply Voltage: 3 V or 5 V

The devices are offered in a 16-pin leadless package

and incorporate a power-down mode for quiescent

power savings.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PowerPAD is a trademark of Texas Instruments.

PRODUCTION DATA information is current as of publication date.

Copyright © 2003–2005, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.