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ADS1113 Datasheet(PDF) 32 Page - Texas Instruments |
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ADS1113 Datasheet(HTML) 32 Page - Texas Instruments |
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32 / 43 page ![]() 32 ADS1018 SBAS526D – NOVEMBER 2012 – REVISED SEPTEMBER 2019 www.ti.com Product Folder Links: ADS1018 Submit Documentation Feedback Copyright © 2012–2019, Texas Instruments Incorporated 12 Device and Documentation Support 12.1 Documentation Support 12.1.1 Related Documentation For related documentation see the following: • Texas Instruments, Precision Thermocouple Measurement with the ADS1118 application reports • Texas Instruments, ADS1118EVM User Guide and Software Tutorial user guide • Texas Instruments, 430BOOST-ADS1118 BoosterPack user guide • Texas Instruments, ADS1118 Boosterpack quick start • Texas Instruments, A Glossary of Analog-to-Digital Specifications and Performance Characteristics application report 12.2 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 12.3 Community Resources TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. 12.4 Trademarks E2E is a trademark of Texas Instruments. SPI is a trademark of Motorola. All other trademarks are the property of their respective owners. 12.5 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 12.6 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. |
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