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OPA890 Datasheet(PDF) 2 Page - Texas Instruments |
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OPA890 Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 41 page ![]() ABSOLUTE MAXIMUM RATINGS (1) PIN ASSIGNMENTS 1 2 3 4 8 7 6 5 +V S OutB -InB +InB OutA -InA +InA -VS A B TopView SO-8 TopView MSOP-10 1 2 3 4 5 10 9 8 7 6 -InA OutA +V S OutB -InB +InA DISA -VS DISB +InB OPA2889 SBOS373B – JUNE 2007 – REVISED AUGUST 2008 ....................................................................................................................................................... www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) SPECIFIED PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT PRODUCT PACKAGE-LEAD DESIGNATOR RANGE MARKING NUMBER MEDIA, QUANTITY OPA2889ID Rail, 75 OPA2889 SO-8 D –40°C to +85°C OP2889 OPA2889IDR Tape and Reel, 2500 OPA2889IDGST Tape and Reel, 250 OPA2889 MSOP-10 DGS –40°C to +85°C BZY OPA2889IDGSR Tape and Reel, 2500 (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. Over operating free-air temperature range, unless otherwise noted. OPA2889 UNIT Power supply ±6.5 V Internal power dissipation See Thermal Characteristics Input voltage range ±VS V Storage temperature range –65 to +125 °C Lead temperature (soldering, 10s) +260 °C Maximum junction temperature (TJ) +150 °C Maximum junction temperature (TJ), continuous operation +140 °C ESD Rating: Human body model (HBM) 2000 V Charge device model (CDM) 1000 V Machine model (MM) 150 V (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. 2 Submit Documentation Feedback Copyright © 2007–2008, Texas Instruments Incorporated Product Folder Link(s): OPA2889 |
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