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IMXRT1160AXEC Datasheet(PDF) 80 Page - NXP Semiconductors

Part # IMXRT1160AXEC
Description  i.MX RT1160 Crossover Processors Data Sheet for Extended Industrial Products
PDF  130 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

IMXRT1160AXEC Datasheet(HTML) 80 Page - NXP Semiconductors

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i.MX RT1160 Crossover Processors Data Sheet for Extended Industrial Products, Rev. 4, 06/2025
80
NXP Semiconductors
Electrical characteristics
RAS
Analog source resistance
—
—
5
K
3
fADCK
ADC conversion clock
frequency
8
—
88
MHz
—
Csample
Sample cycles
3.5
—
131.5
Cycles
4
Ccompare
Fixed compare cycles
—
17.5
—
Cycles
—
Cconversion
Conversion cycles
Cconversion = Csample + Ccompare
Cycles
—
DNL
Differential nonlinearity
—
±0.7
±1
LSB
5,6,7
INL
Integral nonlinearity
—
±0.8
±1
LSB
5,6,7
ENOB
Effective number of bits
8,9,10
Single-ended mode
Avg = 1
10.0
10.3
—
—
Avg = 2
10.4
10.6
—
—
Avg = 16
11.2
11.3
—
—
Differential mode
Avg = 1
11.0
11.2
—
—
Avg = 2
—
—
—
—
Avg = 16
—
—
—
—
SINAD
Signal to noise plus distortion SINAD = 6.02 x ENOB + 1.76
dB
—
EG
Gain error11
—
-0.16
-0.56
%FSV
12
EO
Offset error
—
±0.01
±0.02
%FSV
13
lin_ext_leak
External channel leakage
current
—
30
500
nA
—
EIL
Input leakage error
RAS * lin_ext_leak
mV
—
tADCSTUP
Setup time
—
5
—
s
—
1 Values in this table are based on test with limited matrix samples in lab environment.
2 Typical values assume Temp = 25 °C and fACLK = Max, unless otherwise stated. Typical values are for reference only, and are
not tested in production.
3 This resistance is external to the SoC. To achieve the best results, the analog source resistance must be kept as low as
possible. The results in this data sheet were derived from a system that had < 15 Ω analog source resistance.
4 See Figure 35, "Sample time VS. RAS".
5 1 LSB = (VREFH - VREFL) / 2^N, N = 12
6 ADC conversion clock at max frequency and using linear histogram.
7 No missing code
8 Input data used for test is 1 kHz sine wave.
9 Measured at VREFH = 1.68 V and pwrsel = 2.
10 ENOB can be lower than shown, if an ADC channel corrupts other ADC channels through capacitive coupling. This coupling
may be dominated by board parasitics. Care must be taken not to corrupt the desired channel being measured. This coupling
becomes worse at higher analog frequencies and with switching waveforms due to the harmonic content.
Table 76. ADC electrical specifications (VREFH = 1.68 V and VADINmax ≤ NVCC_GPIOmax)1 (continued)
Symbol
Description
Min
Typ2
Max
Unit
Notes



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