DIO7416

Version 1.2, Sep 2025

www.dioo.com

© 2025 Dioo Microcircuits Co., Ltd. Jiangsu

3

4. ESD Ratings

When a statically-charged person or object touches an electrostatic discharge sensitive device, the

electrostatic charge might be drained through sensitive circuitry in the device. If the electrostatic discharge

possesses sufficient energy, damage might occur to the device due to localized overheating.

Model

Metric

Value

Unit

Human-body model

ANSI/ESDA/JEDEC JS-001

±6500

V

Charged-device model

ANSI/ESDA/JEDEC JS-002

±2000

V

5. Thermal Considerations

The thermal resistance determines the heat insulation property of a material. The higher the thermal

resistance is, the lower the heat loss. Accumulation of heat energy degrades the performance of

semiconductor components.

Symbol

Parameter

Value

Unit

RθJA

Junction-to-ambient thermal

resistance

DFN1.4*1-8

177.6

°C/W

DFN1.35*0.8-8

199.3

°C/W

TSOT23-8

212.5

°C/W

RθJC(top)

Junction-to-case (top) thermal

resistance

DFN1.4*1-8

98.7

°C/W

DFN1.35*0.8-8

26.4

°C/W

TSOT23-8

105.3

°C/W