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PCI2060 Datasheet(PDF) 39 Page - Texas Instruments |
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PCI2060 Datasheet(HTML) 39 Page - Texas Instruments |
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39 / 76 page ![]() Principles of Operation 31 April 2005 SCPS096A Table 3−14. JTAG Instructions and Op Codes INSTRUCTION OP CODE DESCRIPTION EXTEST 00000 Drives terminals from the boundary scan register SAMPLE 00001 Samples I/O terminals CLAMP 00100 Drives terminals from the boundary scan register and selects the bypass register for shifts. HIGHZ 00101 Puts all outputs and I/O terminals except for the TDO terminal into a high-impedance state. BYPASS 11111 Selects the bypass register for shifts 3.13.3 1-Bit Bypass Register The 1-bit bypass register is a 1-bit shift register that provides a means for effectively bypassing the JTAG test logic through a single-bit serial connection through the chip from TDI to TDO. At board-level testing, this helps reduce overall length of the scan ring. 3.13.4 Boundary Scan Register The boundary-scan register is a single-shift register-based path formed by boundary-scan cells placed at the chip’s signal terminals. The register is accessed through the JTAG port’s TDI and TDO terminals. 3.13.4.1 Boundary-Scan Register Cells Each boundary-scan cell operates in conjunction with the current instruction and the current state in the test access port controller state machine. The function of the boundary-scan register cells is determined by the associated terminals, as follows: • Input-only terminals—The boundary-scan cell is basically a 1-bit shift register. The cell supports sample and shift functions. • Output-only terminals—The boundary-scan cell comprises a 1-bit shift register and an output multiplexer. The cell supports the sample, shift, and drive output functions. • Bidirectional terminals—The boundary-scan cell is identical to the output-only terminal cell, but it captures test data from the incoming data line. The cell supports sample, shift, drive output, and hold output functions. It is used at all I/O terminals. The information in Table 3−15 is for implementation of boundary scan interface signals to permit in-circuit testing. |
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