CLC021

SNLS068H – MAY 2000 – REVISED APRIL 2013

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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

ABSOLUTE MAXIMUM RATINGS

(1) (2)

CLC021AVGZ-5.0V

6.0V

CLC021AVGZ-3.3V

4.0V

CLC021AVGZ-5.0V

CLC021AVGZ-3.3V

CLC021AVGZ-5.0V

CLC021AVGZ-3.3V

CMOS/TTL Input Current (single input)

−5 mA

+5 mA

Input Current, Other Inputs

±1 mA

CMOS/TTL Output Source/Sink Current

±16 mA

SDO Output Source Current

22 mA

Package Thermal

(@ 0 LFM airflow)

60°C/W

Resistance

(@ 500 LFM airflow)

43°C/W

17°C/W

Storage Temp. Range

−65°C to +150°C

Junction Temperature

+150°C

Lead Temperature

Soldering 4 Sec

+260°C

ESD Rating (HBM)

2 kV

ESD Rating (MM)

150V

Transistor Count

33,400

(1)

Absolute Maximum Ratings are those parameter values beyond which the life and operation of the device cannot be ensured. The

stating herein of these maximums shall not be construed to imply that the device can or should be operated at or beyond these values.

The table of Electrical Characteristics specifies acceptable device operating conditions.

(2)

It is anticipated that this device will not be offered in a military qualified version. If Military/Aerospace specified devices are required,

please contact the Texas Instruments Sales Office / Distributors for availability and specifications.

RECOMMENDED OPERATING CONDITIONS

CLC021AVGZ-5.0

5.0V ±10%

CLC021AVGZ-3.3

3.3V ±10%

CMOS/TTL Input Voltage

Maximum DC Bias on SDO pins

CLC021AVGZ-5.0

3.0V ±10%

CLC021AVGZ-3.3

1.3V ±10%

10 to 40MHz

45 to 55%

1.0 to 3.0 ns

0°C to +70°C

4

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