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SAM4L Datasheet(PDF) 74 Page - ATMEL Corporation |
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SAM4L Datasheet(HTML) 74 Page - ATMEL Corporation |
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74 / 176 page ![]() 74 42023GS–SAM–03/2014 ATSAM4L8/L4/L2 8.7.14 JTAG Instructions Refer to the ARM Debug Interface v5.1 Architecture Specification for more details on ABORT, DPACC, APACC and IDCODE instructions. 8.7.14.1 EXTEST This instruction selects the boundary-scan chain as Data Register for testing circuitry external to the chip package. The contents of the latched outputs of the boundary-scan chain is driven out as soon as the JTAG IR-register is loaded with the EXTEST instruction. Starting in Run-Test/Idle, the EXTEST instruction is accessed the following way: 1. Select the IR Scan path. 2. In Capture-IR: The IR output value is latched into the shift register. 3. In Shift-IR: The instruction register is shifted by the TCK input. 4. In Update-IR: The data from the boundary-scan chain is applied to the output pins. 5. Return to Run-Test/Idle. 6. Select the DR Scan path. 7. In Capture-DR: The data on the external pins is sampled into the boundary-scan chain. 8. In Shift-DR: The boundary-scan chain is shifted by the TCK input. 9. In Update-DR: The data from the scan chain is applied to the output pins. 10. Return to Run-Test/Idle. 8.7.14.2 SAMPLE_PRELOAD This instruction takes a snap-shot of the input/output pins without affecting the system operation, and pre-loading the scan chain without updating the DR-latch. The boundary-scan chain is selected as Data Register. Starting in Run-Test/Idle, the Device Identification register is accessed in the following way: DR Size Shows the number of bits in the data register chain when this instruction is active. Example: 32 bits DR input value Shows which bit pattern to shift into the data register in the Shift-DR state when this instruction is active. DR output value Shows the bit pattern shifted out of the data register in the Shift-DR state when this instruction is active. Table 8-4. Instruction Description (Continued) Instruction Description Table 8-5. EXTEST Details Instructions Details IR input value 0000 (0x0) IR output value p00s DR Size Depending on boundary-scan chain, see BSDL-file. DR input value Depending on boundary-scan chain, see BSDL-file. DR output value Depending on boundary-scan chain, see BSDL-file. |
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