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SAM4L Datasheet(PDF) 74 Page - ATMEL Corporation

Part # SAM4L
Description  Technology for Ultra-low Power Consumption
PDF  176 Pages
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Manufacturer  ATMEL [ATMEL Corporation]
Direct Link  http://www.atmel.com
Logo ATMEL - ATMEL Corporation

SAM4L Datasheet(HTML) 74 Page - ATMEL Corporation

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74
42023GS–SAM–03/2014
ATSAM4L8/L4/L2
8.7.14
JTAG Instructions
Refer to the ARM Debug Interface v5.1 Architecture Specification for more details on ABORT,
DPACC, APACC and IDCODE instructions.
8.7.14.1
EXTEST
This instruction selects the boundary-scan chain as Data Register for testing circuitry external to
the chip package. The contents of the latched outputs of the boundary-scan chain is driven out
as soon as the JTAG IR-register is loaded with the EXTEST instruction.
Starting in Run-Test/Idle, the EXTEST instruction is accessed the following way:
1.
Select the IR Scan path.
2.
In Capture-IR: The IR output value is latched into the shift register.
3.
In Shift-IR: The instruction register is shifted by the TCK input.
4.
In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5.
Return to Run-Test/Idle.
6.
Select the DR Scan path.
7.
In Capture-DR: The data on the external pins is sampled into the boundary-scan chain.
8.
In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9.
In Update-DR: The data from the scan chain is applied to the output pins.
10. Return to Run-Test/Idle.
8.7.14.2
SAMPLE_PRELOAD
This instruction takes a snap-shot of the input/output pins without affecting the system operation,
and pre-loading the scan chain without updating the DR-latch. The boundary-scan chain is
selected as Data Register.
Starting in Run-Test/Idle, the Device Identification register is accessed in the following way:
DR Size
Shows the number of bits in the data register chain when this instruction is active.
Example: 32 bits
DR input value
Shows which bit pattern to shift into the data register in the Shift-DR state when this
instruction is active.
DR output value
Shows the bit pattern shifted out of the data register in the Shift-DR state when this
instruction is active.
Table 8-4.
Instruction Description (Continued)
Instruction
Description
Table 8-5.
EXTEST Details
Instructions
Details
IR input value
0000 (0x0)
IR output value
p00s
DR Size
Depending on boundary-scan chain, see BSDL-file.
DR input value
Depending on boundary-scan chain, see BSDL-file.
DR output value
Depending on boundary-scan chain, see BSDL-file.



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