BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR WITH SENSE PIN

S-1004 Series

Seiko Instruments Inc.

34

2. Change of detection voltage

If there is not a product with a specified detection voltage value in the S-1004 Series, the detection voltage can be

changed by using a resistance divider or a diode, as seen in Figure 41 to Figure 44.

In Figure 41 and Figure 42, hysteresis width also changes.

GND

R

100 k

Ω

VSS

OUT

VDD

SENSE

CD

GND

VSS

OUT

VDD

SENSE

CD

Figure 41 Detection voltage change

Figure 42 Detection voltage change

when using a resistance divider

when using a resistance divider

(Nch open-drain output product)

(CMOS output product)

Remark

Detection voltage =

Hysteresis width =

GND

R

100 k

Ω

VDD

VSS

OUT

SENSE

CD

GND

VDD

VSS

OUT

SENSE

CD

Figure 43 Detection voltage change

Figure 44 Detection voltage change

when using a diode

when using a diode

(Nch open-drain output product)

(CMOS output product)

Remark

Caution 1. The above connection diagram and constant will not guarantee successful operation.

Perform thorough evaluation using the actual application to set the constant.

2. Set the constants referring to "2. 1 Error when detection voltage is set externally" in

" Operation".