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IS25LP032 Datasheet(PDF) 81 Page - Integrated Silicon Solution, Inc |
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IS25LP032 Datasheet(HTML) 81 Page - Integrated Silicon Solution, Inc |
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81 / 90 page ![]() IS25LP032/064/128 Integrated Silicon Solution, Inc.- www.issi.com 81 Rev. D 10/03/2014 9.8 PROGRAM/ERASE PERFORMANCE Parameter Unit Typ Max Sector Erase Time (4Kbyte) ms 45 300 Block Erase Time (32Kbyte) s 0.15 0.75 Block Erase Time (64Kbyte) s 0.3 1.5 Chip Erase Time (32Mb/64Mb/128Mb) s 8/16/30 23/45/90 Page Programming Time ms 0.2 1.0 Byte Program µs 8 40 Note: These parameters are characterized and not 100% tested. 9.9 RELIABILITY CHARACTERISTICS Parameter Min Unit Test Method Endurance 100,000 Cycles JEDEC Standard A117 Data Retention 20 Years JEDEC Standard A103 ESD – Human Body Model 2,000 Volts JEDEC Standard A114 ESD – Machine Model 200 Volts JEDEC Standard A115 Latch-Up 100 + ICC1 mA JEDEC Standard 78 Note: These parameters are characterized and not 100% tested. |
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