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AT45DB642 Datasheet(PDF) 9 Page - ATMEL Corporation |
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AT45DB642 Datasheet(HTML) 9 Page - ATMEL Corporation |
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9 / 37 page ![]() 9 AT45DB642 1638F–DFLSH–09/02 MAIN MEMORY PAGE TO BUFFER COMPARE: A page of data in main memory can be compared to the data in buffer 1 or buffer 2. To initiate the operation, a 1-byte opcode, 60H for buffer 1 and 61H for buffer 2, must be clocked into the device, followed by three address bytes consisting of 13 page address bits (PA12 - PA0) that specify the page in the main memory that is to be compared to the buffer, and 11 don’t carebits. TheCS pin must be low while toggling the SCK/CLK pin to load the opcode and the address bytes from the input pins (SI or I/O7 - I/O0). On the low-to-high transition of the CS pin, the 1056 bytes in the selected main memory page will be compared with the 1056 bytes in buffer 1 or buffer 2. During this time (tXFR), the status register and the RDY/BUSY pin will indicate that the part is busy. On completion of the compare operation, bit 6 of the status register is updated with the result of the compare. AUTO PAGE REWRITE: This mode is only needed if multiple bytes within a page or multiple pages of data are modified in a random fashion. This mode is a combination of two operations: Main Memory Page to Buffer Transfer and Buffer to Main Memory Page Program with Built-in Erase. A page of data is first transferred from the main memory to buffer 1 or buffer 2, and then the same data (from buffer 1 or buffer 2) is programmed back into its original page of main memory. To start the rewrite operation, a 1-byte opcode, 58H for buffer 1 or 59H for buffer 2, must be clocked into the device, followed by three address bytes comprised of 13 page address bits (PA12 - PA0) that specify the page in main memory to be rewritten and 11 don’t care bits. When a low-to-high transition occurs on the CS pin, the part will first transfer data from the page in main memory to a buffer and then program the data from the buffer back into same page of main memory. The operation is internally self-timed and should take place in a maximum time of tEP. During this time, the status register and the RDY/BUSY pin will indi- cate that the part is busy. If a sector is programmed or reprogrammed sequentially page by page, then the programming algorithm shown in Figure 1 (page 33) is recommended. Otherwise, if multiple bytes in a page or several pages are programmed randomly in a sector, then the programming algorithm shown in Figure 2 (page 34) is recomm ended. Each page within a sector m ust be updated/rewritten at least once within every 10,000 cumulative page erase/program opera- tions in that sector. Operation Mode Summary The modes described can be separated into two groups – modes that make use of the Flash memory array (Group A) and modes that do not make use of the Flash memory array (Group B). Group A modes consist of: 1. Main Memory Page to Buffer 1 (or 2) Transfer 2. Main Memory Page to Buffer 1 (or 2) Compare 3. Buffer 1 (or 2) to Main Memory Page Program with Built-in Erase 4. Buffer 1 (or 2) to Main Memory Page Program without Built-in Erase 5. Page Erase 6. Block Erase 7. Main Memory Page Program through Buffer 8. Auto Page Rewrite 9. Group B modes consist of: 10. Buffer 1 (or 2) Read 11. Buffer 1 (or 2) Write 12. Status Register Read If a Group A mode is in progress (not fully completed), then another mode in Group A should not be started. However, during this time in which a Group A mode is in progress, modes in Group B can be started. |
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