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AT45DB642 Datasheet(PDF) 16 Page - ATMEL Corporation |
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AT45DB642 Datasheet(HTML) 16 Page - ATMEL Corporation |
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16 / 37 page  16 AT45DB642 1638F–DFLSH–09/02 Test Waveforms and Measurement Levels Output Test Load AC Characteristics – Parallel Interface Symbol Parameter Min Max Units fSCK1 CLK Frequency 5MHz fCAR1 CLK Frequency for Continuous Array Read 3 MHz fBARSD1 CLK Frequency for Burst Array Read with Synchronous Delay 5 MHz tWH CLK High Time 80 ns t WL CLK Low Time 80 ns t CS Minimum CS High Time 250 ns t CSS CS Setup Time 250 ns tCSH CS Hold Time 250 ns tCSB CS High to RDY/BUSY Low 150 ns tSU Data In Setup Time 75 ns t H Data In Hold Time 25 ns t HO Output Hold Time 0 ns t DIS Output Disable Time 55 ns tV Output Valid 70 ns tXFR Page to Buffer Transfer/Compare Time 700 µs tEP Page Erase and Programming Time 20 ms t P Page Programming Time 14 ms t PE Page Erase Time 8ms t BE Block Erase Time 12 ms tRST RESET Pulse Width 10 µs tREC RESET Recovery Time 1 µs AC DRIVING LEVELS AC MEASUREMENT LEVEL 0.45V 2.0 0.8 2.4V tR, tF < 3 ns (10% to 90%) DEVICE UNDER TEST 30 pF |
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