AM1705DPTP3 datasheet(34/165 Pages) TI1

34 / 165 page

AM1705

SPRS657E – FEBRUARY 2010 – REVISED JUNE 2014

www.ti.com

Device Operating Conditions

5.1

Absolute Maximum Ratings Over Operating Junction Temperature Range

(Unless Otherwise Noted)

(1)

Core

-0.5 V to 1.4 V

(CVDD, RVDD, PLL0_VDDA ) (2)

I/O, 1.8V

-0.5 V to 2 V

Supply voltage ranges

(USB0_VDDA18) (2)

I/O, 3.3V

-0.5 V to 3.8V

(DVDD, USB0_VDDA33) (2)

VI I/O, 1.2V

-0.3 V to CVDD + 0.3V

(OSCIN)

VI I/O, 3.3V

-0.3V to DVDD + 0.35V

Input voltage ranges

(Steady State)

VI I/O, 3.3V

DVDD + 20%

(Transient)

up to 20% of Signal

Period

VI I/O, USB 5V Tolerant Pins:

5.25V(3)

(USB0_DM, USB0_DP)

VO I/O, 3.3V

-0.5 V to DVDD + 0.3V

(Steady State)

Output voltage ranges

VO I/O, 3.3V

20% of DVDD for up to

(Transient Overshoot/Undershoot)

20% of the signal period

Input or Output Voltages 0.3V above or below their respective power

±20mA

Clamp Current

rails. Limit clamp current that flows through the I/O's internal diode

protection cells.

Commercial (default)

0°C to 90°C

Operating Junction Temperature ranges,

Industrial (D version)

-40°C to 90°C

Extended (A version)

-40°C to 105°C

(1)

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating

conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values are with respect to VSS, PLL0_VSSA, OSCVSS

(3)

Up to a max of 24 hours.

5.2

Handling Ratings

UNIT

Storage temperature

(default)

-55 to 150

°C

range, Tstg

Human Body Model (HBM)(2)

>2000

ESD Stress Voltage,

VESD

(1)

Charged Device Model (CDM)(3)

>500

(1)

Electrostatic discharge (ESD) to measure device sensitivity/immunity to damage caused by electrostatic discharges into the device.

(2)

Level listed above is the passing level per ANSI/ESDA/JEDEC JS-001-2010. JEDEC document JEP155 states that 500V HBM allows

safe manufacturing with a standard ESD control process, and manufacturing with less than 500V HBM is possible if necessary

precautions are taken. Pins listed as 1000V may actually have higher performance.

(3)

Level listed above is the passing level per EIA-JEDEC JESD22-C101E. JEDEC document JEP157 states that 250V CDM allows safe

manufacturing with a standard ESD control process. Pins listed as 250V may actually have higher performance.

Device Operating Conditions

Submit Documentation Feedback

Product Folder Links: AM1705

AM1705DPTP3 Datasheet(PDF) 34 Page - Texas Instruments

AM1705DPTP3 Datasheet(HTML) 34 Page - Texas Instruments

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 ...More

Datasheet Download

Link URL