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QL8050 Datasheet(PDF) 18 Page - List of Unclassifed Manufacturers |
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QL8050 Datasheet(HTML) 18 Page - List of Unclassifed Manufacturers |
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18 / 49 page  ZZZTXLFNORJLFFRP 4XLFN/RJLF&RUSRUDWLRQ (FOLSVH,, )DPLO\ 'DWD 6KHHW5HY % Preliminary • Bypass Instruction. The Bypass instruction allows data to skip a device's boundary scan entirely, so the data passes through the bypass register. The Bypass instruction allows users to test a device without passing through other devices. The bypass register is connected between the TDI and TDO pins, allowing serial data to be transferred through a device without affecting the operation of the device. -7$* %6'/6XSSRUW • BSDL-Boundary Scan Description Language • Machine-readable data for test equipment to generate testing vectors and software • BSDL files available for all device/ package combinations from QuickLogic • Extensive industry support available and ATVG (Automatic Test Vector Generation) 6HFXULW\IXVHV There are two security links: one to disable reading logic from the array, and the second to disable JTAG access to the device. Programming these optional links completely disables access to the device from the outside world and provides an extra level of design security not possible in SRAM- based FPGAs. The option to program these fuses is selectable via QuickWorks in the Tools/Options/Device Programming window in SpDE. )OH[LELOLW\IXVH The flexibility link enables Power-Up loading of the Embedded RAM blocks. If the link is programmed, the Power Up Loading state machine is activated during power-up of the device. The state machine communicates with an external EPROM via the JTAG pins to download memory contents into the on-chip RAM. If the link is not programmed, Power-Up Loading is not enabled and the JTAG pins function as they normally would. The option to program this bit is selectable via QuickWorks in the Tools/Options/Device Programming window in SpDE. For more information on Power-Up Loading refer to QuickLogic Application Note 55. |
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