VN7140AS datasheet(30/55 Pages) STMICROELECTRONICS

30 / 55 page

Application information

VN7140AJ, VN7140AS

30/55

DocID027401 Rev 3

4.1.1

Diode (DGND) in the ground line

A resistor (typ. RGND = 4.7

kΩ) should be inserted in parallel to DGND if the device drives an

inductive load.

This small signal diode can be safely shared amongst several different HSDs. Also in this

case, the presence of the

ground network produces a shift (≈600 mV) in the input threshold

and in the status output values if the microprocessor ground is not common to the device

ground. This shift does not vary if more than one HSD shares the same diode/resistor

network.

4.2

Immunity against transient electrical disturbances

The immunity of the device against transient electrical emissions, conducted along the

supply lines and injected into the VCC pin, is tested in accordance with ISO7637-2:2011 (E)

and ISO 16750-2:2010.

The related function performance status classification is shown in Table 12: "ISO 7637-2 -

electrical transient conduction along supply line".

Test pulses are applied directly to DUT (Device Under Test) both in ON and OFF-state and

in accordance to ISO 7637-2:2011(E), chapter 4. The DUT is intended as the present

device only, without components and accessed through VCC and GND terminals.

Status II is defined in ISO 7637-1 Function Performance Status Classification (FPSC) as

follows: “The function does not perform as designed during the test but returns

automatically to normal operation after the test”.

Table 12: ISO 7637-2 - electrical transient conduction along supply line

Test

Pulse

2011(E)

Test pulse severity

level with Status II

functional performance

status

Minimum

number of

pulses or test

time

Burst cycle /

pulse

repetition time

Pulse duration and

pulse generator

internal impedance

Level

US(1)

min

max

III

-112 V

500 pulses

0.5 s

2 ms, 10 Ω

III

+55 V

500 pulses

0.2 s

5 s

50 µs, 2 Ω

-220 V

90 ms

100

0.1 µs, 50 Ω

+150 V

90 ms

100

0.1

µs, 50 Ω

4 (2)

-7 V

1 pulse

100 ms, 0.01

Load dump according to ISO 16750-2:2010

Test B (3)

40 V

5 pulse

1 min

400 ms, 2 Ω

Notes:

(1)US is the peak amplitude as defined for each test pulse in ISO 7637-2:2011(E), chapter 5.6.

(2)Test pulse from ISO 7637-2:2004(E).

(3)With 40 V external suppressor referred to ground (-40°C < Tj < 150 °C).

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