Si511 datasheet(5/26 Pages) SILABS

5 / 26 page

Si510/511

Rev. 1.2

Table 2. Output Clock Frequency Characteristics

VDD = 1.8 V ±5%, 2.5 or 3.3 V ±10%, TA = –40 to +85 oC

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Nominal Frequency

CMOS, Dual CMOS

0.1

—

212.5

MHz

LVDS/LVPECL/HCSL

0.1

—

250

MHz

Total Stability*

Frequency Stability Grade C

–30

—

+30

ppm

Frequency Stability Grade B

–50

—

+50

ppm

Frequency Stability Grade A

–100

—

+100

ppm

Temperature Stability

Frequency Stability Grade C

–20

—

+20

ppm

Frequency Stability Grade B

–25

—

+25

ppm

Frequency Stability Grade A

–50

—

+50

ppm

Startup Time

TSU

Minimum VDD until output

frequency (FO) within specification

——

Disable Time

FO  10 MHz

—

µs

FO <10MHz

—

µs

Enable Time

FO  10 MHz

—

µs

FO <10MHz

—

µs

*Note:

Total stability includes initial accuracy, operating temperature, supply voltage change, load change, shock and vibration

(not under operation), and 10 years aging at 40 oC.

Si511 Datasheet(PDF) 5 Page - Silicon Laboratories

Si511 Datasheet(HTML) 5 Page - Silicon Laboratories

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26

Datasheet Download

Link URL