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MXB7846EEE Datasheet(PDF) 21 Page - Maxim Integrated Products |
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MXB7846EEE Datasheet(HTML) 21 Page - Maxim Integrated Products |
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21 / 23 page ![]() 2.375V to 5.25V, 4-Wire Touch-Screen Controller with Internal Reference and Temperature Sensor ______________________________________________________________________________________ 21 Differential Nonlinearity Differential nonlinearity (DNL) is the difference between an actual step width and the ideal value of 1LSB. A DNL error specification of less than 1LSB guarantees no missing codes and a monotonic transfer function. Aperture Jitter Aperture jitter (tAJ) is the sample-to-sample variation in the time between the samples. Aperture Delay Aperture delay (tAD) is the time defined between the falling edge of the sampling clock and the instant when an actual sample is taken. Chip Information TRANSISTOR COUNT: 12,000 PROCESS: 0.6µm BiCMOS 16 15 14 13 12 11 10 9 1 2 3 4 5 6 7 8 +VDD SERIAL/CONVERSION CLOCK CHIP SELECT SERIAL DATA IN CONVERTER STATUS SERIAL DATA OUT PEN INTERRUPT 50kΩ X+ Y+ X- Y- GND BAT AUX VOLTAGE REGULATOR AUXILIARY INPUT TO BATTERY TOUCH SCREEN 2.375V TO 5.5V 1µF TO 10µF OPTIONAL 0.1µF 0.1µF MXB7846 DCLK CS DIN PENIRQ BUSY DOUT +VDD REF Typical Application Circuit |
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