LM5145 datasheet(6/67 Pages) TI1

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LM5145

SNVSAI4 – JUNE 2017

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(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

7 Specifications

7.1 Absolute Maximum Ratings

Over the recommended operating junction temperature range of –40°C to 125°C (unless otherwise noted).

(1)

MIN

MAX

UNIT

Input voltages

VIN

–0.3

105

–1

105

SW (20-ns transient)

–5

105

ILIM

–1

105

EN/UVLO

–0.3

105

VCC

–0.3

FB, COMP, SS/TRK, RT

–0.3

SYNCIN

–0.3

Output voltages

BST

–0.3

115

BST to VCC

105

BST to SW

–0.3

VCC to BST (20-ns transient)

LO (20-ns transient)

–3

PGOOD

–0.3

Operating junction temperature, TJ

150

°C

Storage temperature, Tstg

–55

150

°C

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

7.2 ESD Ratings

VALUE

UNIT

V(ESD)

Electrostatic discharge

Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)

±2000

Charged-device model (CDM), per JEDEC specification JESD22-C101(2)

±1000

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