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AD5662ARM Datasheet(PDF) 8 Page - Analog Devices

Part # AD5662ARM
Description  2.7 V to 5.5 V, 250 uA, Rail-to-Rail Output 16-Bit DAC D/A in a SOT-23
PDF  20 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AD5662ARM Datasheet(HTML) 8 Page - Analog Devices

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AD5662
Preliminary Technical Data
Rev. PrA | Page 8 of 20
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer
function. A typical INL versus code plot can be seen in Figure 4.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. A typical DNL versus code plot can be
seen in Figure 5.
Zero-Code Error
Zero-code error is a measure of the output error when zero
code (0x0000) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5662 because the output of the DAC cannot go below 0 V. It
is due to a combination of the offset errors in the DAC and the
output amplifier. Zero-code error is expressed in mV. A plot of
zero-code error versus temperature can be seen in Figure 8.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded to the DAC register. Ideally, the output
should be VDD − 1 LSB. Full-scale error is expressed in percent
of full-scale range. A plot of full-scale error versus temperature
can be seen in Figure 8.
Gain Error
This is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from ideal
expressed as a percent of the full-scale range.
Total Unadjusted Error
Total unadjusted error (TUE) is a measure of the output error,
taking all the various errors into account. A typical TUE versus
code plot can be seen in Figure 6.
Zero-Code Error Drift
This is a measure of the change in zero-code error with a
change in temperature. It is expressed in µV/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s,
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000). See
Figure 21.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-s, and measured with a full-scale code change
on the data bus, i.e., from all 0s to all 1s and vice versa.



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