| Electronic Components Datasheet Search |
|
DLPC3479 Datasheet(PDF) 6 Page - Texas Instruments |
|
|
|
|||||||||||||||||||||||||||||
DLPC3479 Datasheet(HTML) 6 Page - Texas Instruments |
|
6 / 61 page ![]() 6 DLPC3479 DLPS112 – JUNE 2018 www.ti.com Product Folder Links: DLPC3479 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Pin Functions – Board Level Test, Debug, and Initialization (continued) PIN I/O DESCRIPTION NAME NUMBER TSTPT_1 R13 B1 Test pin 1 (includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Normal use: Reserved for test output. Leave open or unconnected for normal use. Note: Do not apply an external pullup to this pin to avoid putting the DLPC3479 in a test mode. Without external pullup(2) Feeds TMSEL(1) With external pullup(3) Feeds TMSEL(1) TSTPT_2 R14 B1 Test pin 2 (includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Normal use: Reserved for test output. Leave open or unconnected for normal use. Note: Do not apply an external pullup to this pin to avoid putting the DLPC3479 in a test mode. Without external pullup(2) Feeds TMSEL(2) With external pullup(3) Feeds TMSEL(2) TSTPT_3 R15 B1 Test pin 3 (includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Normal use: Reserved for test output. Leave open or unconnected for normal use. TSTPT_4 P14 B1 Test pin 4 (includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Reserved for TRIG_OUT_1 signal (Output) TSTPT_5 P15 B1 Test pin 5 (includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Normal use: Reserved for test output. Leave open or unconnected for normal use. TSTPT_6 N14 B1 Test pin 6 (includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Normal use: Reserved for test output. Leave open or unconnected for normal use. Alternative use: None. External logic shall not unintentionally pull this pin high to avoid putting the DLPC3479 in a test mode. TSTPT_7 N15 B1 Test pin 7 (includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Normal use: Reserved for test output. Leave open or unconnected for normal use. |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |