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MPC755 Datasheet(PDF) 22 Page - NXP Semiconductors |
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MPC755 Datasheet(HTML) 22 Page - NXP Semiconductors |
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22 / 56 page ![]() MPC755 RISC Microprocessor Hardware Specifications, Rev. 8 22 Freescale Semiconductor Electrical and Thermal Characteristics 4.2.5 IEEE 1149.1 AC Timing Specifications Table 13 provides the IEEE 1149.1 (JTAG) AC timing specifications as defined in Figure 12 through Figure 15. Figure 11 provides the AC test load for TDO and the boundary-scan outputs of the MPC755. Figure 11. AC Test Load for the JTAG Interface Table 13. JTAG AC Timing Specifications (Independent of SYSCLK) 1 At recommended operating conditions (see Table 3) Parameter Symbol Min Max Unit Notes TCK frequency of operation fTCLK 016 MHz TCK cycle time tTCLK 62.5 — ns TCK clock pulse width measured at 1.4 V tJHJL 31 — ns TCK rise and fall times tJR, tJF 02 ns TRST assert time tTRST 25 — ns 2 Input setup times: Boundary-scan data TMS, TDI tDVJH tIVJH 4 0 — — ns 3 Input hold times: Boundary-scan data TMS, TDI tDXJH tIXJH 15 12 — — ns 3 Valid times: Boundary-scan data TDO tJLDV tJLOV — — 4 4 ns 4 Output hold times: Boundary-scan data TDO tJLDH tJLOH 25 12 — — ns 4 TCK to output high impedance: Boundary-scan data TDO tJLDZ tJLOZ 3 3 19 9 ns 4, 5 Notes: 1. All outputs are measured from the midpoint voltage of the falling/rising edge of TCLK to the midpoint of the signal in question. The output timings are measured at the pins. All output timings assume a purely resistive 50- Ω load (see Figure 11). Time-of-flight delays must be added for trace lengths, vias, and connectors in the system. 2. TRST is an asynchronous level sensitive signal which must be asserted for this minimum time to be recognized. 3. Non-JTAG signal input timing with respect to TCK. 4. Non-JTAG signal output timing with respect to TCK. 5. Guaranteed by design and characterization. Output Z0 = 50 Ω OVDD/2 RL = 50 Ω |
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