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ADF4157 Datasheet(PDF) 16 Page - Analog Devices |
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ADF4157 Datasheet(HTML) 16 Page - Analog Devices |
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16 / 20 page ![]() ADF4157 Rev. 0 | Page 16 of 20 TEST REGISTER (R4) MAP Reserved Bits With R3[2, 1, 0] set to [1, 0, 0], the on-chip test register (R4) is programmed as shown in Figure 21. DB[31:3] should be set to 0 in this register. DB31 RESERVED CONTROL BITS DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 00 000 00 00 00 000 00 00 00 000 00 00 00 C3(1) C2(0) C1(0) SET THESE BITS TO 0 Figure 21. Test Register (R4) Map |
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