ZIOL2201 datasheet(51/92 Pages) RENESAS

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ZIOL2xxx Datasheet

April 26, 2016

3.3.11. Die Temperature Measurement

Figure 3.18 illustrates the die temperature measurement of the ZIOL2xxx IC. The die temperature is measured

with an on-chip sensor right in the center of the silicon die. Since there is one temperature sensor which has a

certain distance to all the different locations that produce heat (due to dissipated electrical power), the sensor can

only indicate a rough average value of the die temperature. This shall be considered in defining the alarm values

for the over-temperature counter and in defining the over-temperature lock mode duration.

In combination with four comparators the temperature sensor circuit provides five temperature levels that

correspond to certain temperatures as described in Table 3.8. The current die temperature (level) can be retrieved

in reading the status register MON_DEVICE_TEMP[19].

Table 3.8

Temperature Sensor Levels

Temperature

Level

Typical Trigger

Temperature

Value

Min.

Trig.

Max.

Trig.

Unit

MON_DEVICE_TEMP[19]

value

Remarks / OVER_TEMP

value for over-

temperature exception

Blue

< 95

°C

0b0000

No comparator level

reached

Green

> 100

105

°C

0b0001

Yellow

> 110

105

115

°C

0b0011

0b0010

Orange

> 120

115

125

°C

0b0111

0b0100

Red

> 130

125

135

°C

0b1111

0b1000

Software-Test

n.a.

0bxxxx

0b0000

1) The mentioned typical values of IC properties shall not be considered as statistical guaranteed mean values.

2) The tolerance (deviation from the typical trigger value) is ±5°C. The deviation is for all trigger values the same. This means for

example that in extreme situations all trigger levels equal the min. temperature or the max. temperature trigger value.

3) Setting configuration register[7][3:0] = 0b1111 will cause an over-temperature exception immediately. This setting is supposed to

be used while software development and not supposed to be used in regular operation.

4) There is a deviating code 0b1111for the software test which valid for Rev A only.

The configuration-register OVT_TEMPERATURE defines what temperature level causes an over-temperature

exception (Figure 3.18/Table 3.8). This configuration feature ensures a flexibility of the IC in various application

cases.

Depending on the IC configuration an over-temperature can cause disabled HV drivers in order to prevent the IC

against damage. Besides the DC/DC converter all other IC building feature will still function, also if a over-

temperature exception has been detected

1. Thus all control and diagnostic functions are still available if the IC is

being overheated.

3.4.

Smart Power Supply

The internal low voltage supply of the chip is 3.3V and generated by an on chip linear regulator. In order to

decouple this voltage a capacitor needs to be connected externally. Since the regulator supports more load

current than the IC requires itself, a certain current can be drawn by the external application (Table 2.2).

1 This security shutdown of the DC/DC converter is not implemented in the IC revision A but prearranged for later easy implementation.

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