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BLF871 Datasheet(PDF) 3 Page - NXP Semiconductors |
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BLF871 Datasheet(HTML) 3 Page - NXP Semiconductors |
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3 / 18 page ![]() BLF871_2 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 02 — 5 March 2009 3 of 18 NXP Semiconductors BLF871 UHF power LDMOS transistor 5. Thermal characteristics [1] Rth(j-c) is measured under RF conditions. 6. Characteristics [1] ID is the drain current. Table 5. Thermal characteristics Symbol Parameter Conditions Typ Unit Rth(j-c) thermal resistance from junction to case Tcase =80 °C; PL(AV) =50W [1] 0.95 K/W Table 6. Characteristics Tj =25 °C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit V(BR)DSS drain-source breakdown voltage VGS =0V; ID = 1.12 mA [1] 89 - 105.5 V VGS(th) gate-source threshold voltage VDS = 10 V; ID = 112 mA [1] 1.4 - 2.4 V IDSS drain leakage current VGS =0V; VDS =40V - - 1.4 µA IDSX drain cut-off current VGS =VGSth + 3.75 V; VDS =10V 16.7 20 - A IGSS gate leakage current VGS =10V; VDS = 0 V - - 140 nA RDS(on) drain-source on-state resistance VGS =VGSth + 3.75 V; ID = 3.7 A [1] - 210 - m Ω Ciss input capacitance VGS = 0 V; VDS =40V; f=1MHz -95 - pF Coss output capacitance VGS = 0 V; VDS =40V; f=1MHz -30 - pF Crss reverse transfer capacitance VGS = 0 V; VDS =40V; f=1MHz -1 - pF |
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