Sensors

Freescale Semiconductor

4

MAG3110

2

Operating and Electrical Specifications

2.1

Operating Characteristics

2.2

Absolute Maximum Ratings

Stresses above those listed as “absolute maximum ratings” may cause permanent damage to the device. This is a stress rating

only and functional operation of the device under these conditions is not implied. Exposure to maximum rating conditions for

extended periods may affect device reliability.

Table 2. Operating Characteristics @ VDD = 1.8 V, T = 25°C unless otherwise noted.

Parameter

Test Conditions

Symbol

Min

Typ

Max

Unit

Full Scale Range

FS

±1000

µT

Output Data Range (RAW = 1)

-15,000

15,000

bits

Output Data Range (RAW = 0)

-30,000

30,000

bits

Sensitivity

So

0.10

µT/bits

Sensitivity Change vs. Temperature

Tc

±0.1

%/°C

Zero Flux Offset Accuracy

±500

µT

Zero Flux Change with Temperature

Tco

±0.01

µT/°C

Hysteresis

1%

Non Linearity

Best Fit Straight Line

NL

-1

±0.3

1

%FS

Temp Sensor Repeatability

1°C

Magnetometer Output Noise

1. OS = Over Sampling Ratio.

Noise

0.14

µT rms

OS = 01

0.1

OS = 10

0.07

OS = 11

0.05

X-axis

Y-axis

Z-axis

2. Self-test is one direction only.

Vst

20

LSB

20

LSB

20

LSB

Operating Temperature Range

-40

+85

°C

Table 3. Maximum Ratings

Rating

Symbol

Value

Unit

Supply Voltage

VDD

-0.3 to +3.6

V

Input Voltage on any Control Pin (SCL, SDA)

Vin

-0.3 to VDD + 0.3

V

Maximum Applied Magnetic Field

—

100,000

µT

Operating Temperature Range

-40 to +85

°C

Storage Temperature Range

-40 to +125

°C

Table 4. ESD and Latch-up Protection Characteristics

Rating

Symbol

Value

Unit

Human Body Model

HBM

±2000

V

Machine Model

MM

±200

V

Charge Device Model

CDM

±500

V

Latch-up Current at T = 85°C

—

±100

mA

This device is sensitive to mechanical shock. Improper handling can cause permanent damage of the part or

cause the part to otherwise fail.

This is an ESD sensitive, improper handling can cause permanent damage to the part.