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STM32F407IG Datasheet(PDF) 112 Page - STMicroelectronics

Part # STM32F407IG
Description  USB OTG HS/FS, Ethernet, 17 TIMs, 3 ADCs, 15 comm. interfaces & camera
PDF  154 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F407IG Datasheet(HTML) 112 Page - STMicroelectronics

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Electrical characteristics
STM32F405xx, STM32F407xx
112/154
Doc ID 022152 Rev 1
5.3.21
Temperature sensor characteristics
5.3.22
VBAT monitoring characteristics
5.3.23
Embedded reference voltage
The parameters given in Table 68 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 10.
Table 66.
TS characteristics
Symbol
Parameter
Min
Typ
Max
Unit
TL
(1)
VSENSE linearity with temperature
-
±1
±2°C
Avg_Slope(1) Average slope
-
2.5
mV/°C
V25
(1)
Voltage at 25 °C
-
0.76
V
tSTART
(2)
Startup time
-
6
10
µs
TS_temp
(3)(2)
ADC sampling time when reading the temperature (1 °C accuracy)
10
-
-
µs
1.
Based on characterization, not tested in production.
2.
Guaranteed by design, not tested in production.
3.
Shortest sampling time can be determined in the application by multiple iterations.
Table 67.
VBAT monitoring characteristics
Symbol
Parameter
Min
Typ
Max
Unit
R
Resistor bridge for VBAT
-50-
K
Ω
Q
Ratio on VBAT measurement
-
2
-
Er(1)
Error on Q
–1
-
+1
%
TS_vbat
(2)(2)
ADC sampling time when reading the VBAT
1 mV accuracy
5-
-
µs
1.
Guaranteed by design, not tested in production.
2.
Shortest sampling time can be determined in the application by multiple iterations.
Table 68.
Embedded internal reference voltage
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VREFINT
Internal reference voltage
–40 °C < TA < +105 °C 1.18
1.21
1.24
V
TS_vrefint
(1)
ADC sampling time when reading the
internal reference voltage
10
-
-
µs
VRERINT_s
(2)
Internal reference voltage spread over the
temperature range
VDD = 3 V
-
3
5
mV
TCoeff
(2)
Temperature coefficient
-
30
50
ppm/°C
tSTART
(2)
Startup time
-
6
10
µs
1.
Shortest sampling time can be determined in the application by multiple iterations.
2.
Guaranteed by design, not tested in production.



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