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LTC3880 Datasheet(PDF) 22 Page - Linear Technology |
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LTC3880 Datasheet(HTML) 22 Page - Linear Technology |
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22 / 50 page ![]() LTC3839 22 3839fa APPLICATIONS INFORMATION To maintain a good signal-to-noise ratio for the current sense signal, start with a ∆VSENSE of 10mV. For a DCR sensing application, the actual ripple voltage will be de- termined by: ΔV SENSE = V IN –VOUT R1• C1 • V OUT V IN •f Power MOSFET Selection Two external N-channel power MOSFETs must be selected for each channel of the LTC3839 controller: one for the top (main) switch and one for the bottom (synchronous) switch. The gate drive levels are set by the DRVCC voltage. This voltage is typically 5.3V. Pay close attention to the BVDSS specification for the MOSFETs as well; most of the logic-level MOSFETs are limited to 30V or less. Selection criteria for the power MOSFETs include the on- resistance, RDS(ON), Miller capacitance, CMILLER, input voltage and maximum output current. Miller capacitance, CMILLER, can be approximated from the gate charge curve usually provided on the MOSFET manufacturers’ data sheet. CMILLER is equal to the increase in gate charge along the horizontal axis while the curve is approximately flat (or the parameter QGD if specified on a manufacturer’s data sheet), divided by the specified VDS test voltage: CMILLER ≅ QGD VDS(TEST) When the IC is operating in continuous mode, the duty cycles for the top and bottom MOSFETs are given by: D TOP = V OUT V IN D BOT = 1– V OUT V IN The MOSFET power dissipations at maximum output current are given by: PTOP = DTOP •IOUT(MAX)2 •RDS(ON)(MAX) 1+δ ()+V IN 2 • IOUT(MAX) 2 ⎛ ⎝⎜ ⎞ ⎠⎟ •CMILLER RTG(UP) VDRVCC –VMILLER + RTG(DOWN) VMILLER ⎡ ⎣ ⎢ ⎤ ⎦ ⎥ •f PBOT = DBOT • IOUT(MAX)2 • RDS(ON)(MAX) • (1 + δ ) where δisthetemperaturedependencyofRDS(ON),RTG(UP) is the TG pull-up resistance, and RTG(DOWN) is the TG pull- down resistance. VMILLER is the Miller effect VGS voltage and is taken graphically from the MOSFET’s data sheet. Both MOSFETs have I2R losses while the topside N-channel equation includes an additional term for transition losses, which are highest at high input voltages. For VIN < 20V, the high current efficiency generally improves with larger MOSFETs, while for VIN > 20V, the transition losses rapidly increase to the point that the use of a higher RDS(ON) device with lower CMILLER actually provides higher efficiency. The synchronous MOSFET losses are greatest at high input voltage when the top switch duty factor is low or during short-circuit when the synchronous switch is on close to 100% of the period. The term (1 + δ) is generally given for a MOSFET in the form of a normalized RDS(ON) vs temperature curve in the power MOSFET data sheet. For low voltage MOSFETs, 0.5% per degree (°C) can be used to estimate δ as an approximation of percentage change of RDS(ON): δ = 0.005/°C • (TJ – TA) where TJ is estimated junction temperature of the MOSFET and TA is ambient temperature. CIN Selection In continuous mode, the source current of the top N- channel MOSFET is a square wave of duty cycle VOUT/ VIN. To prevent large voltage transients, a low ESR input capacitor sized for the maximum RMS current must be used. The worst-case RMS current occurs by assuming a single-phase application. The maximum RMS capacitor current is given by: I RMS ≅ IOUT(MAX) • V OUT V IN • V IN V OUT –1 This formula has a maximum at VIN = 2VOUT, where IRMS = IOUT(MAX)/2. This simple worst-case condition is commonly used for design because even significant deviations do not offer much relief. Note that capacitor manufacturers’ ripple current ratings are often based on only 2000 hours of life. This makes it advisable to further derate the capacitor or to choose a capacitor rated at a |
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