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28F008SA Datasheet(PDF) 23 Page - Intel Corporation

Part # 28F008SA
Description  8-MBIT (1-MBIT x 8) FlashFileTM MEMORY
PDF  33 Pages
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Manufacturer  INTEL [Intel Corporation]
Direct Link  http://www.intel.com
Logo INTEL - Intel Corporation

28F008SA Datasheet(HTML) 23 Page - Intel Corporation

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28F008SA
AC INPUTOUTPUT REFERENCE WAVEFORM(1)
290429 – 11
AC test inputs are driven at VOH (24 VTTL) for a Logic ‘‘1’’ and VOL (045 VTTL) for a Logic
‘‘0’’ Input timing begins at VIH (20 VTTL) and VIL (08 VTTL) Output timing ends at VIH and
VIL Input rise and fall times (10% to 90%) k 10 ns
AC TESTING LOAD CIRCUIT(1)
CL e 100 pF
CL Includes Jig
Capacitance
290429 – 12
RL e 33 kX
HIGH SPEED
AC INPUTOUTPUT REFERENCE WAVEFORM(2)
290429 – 17
AC test inputs are driven at 30V for a Logic ‘‘1’’ and 00V for a Logic ‘‘0’’ Input timing
begins and output timing ends at 15V Input rise and fall times (10% to 90%) k 10 ns
HIGH SPEED
AC TESTING LOAD CIRCUIT(2)
CL e 30 pF
CL Includes Jig
Capacitance
290429 – 18
RL e 33 kX
NOTES
1 Testing characteristics for 28F008SA-85 in Standard configuration and 28F008SA-120
2 Testing characteristics for 28F008SA-85 in High Speed configuration
AC CHARACTERISTICSRead-Only Operations(1)
Versions
VCCg5%
28F008SA-85(4)
Unit
VCCg10%
28F008SA-85(5)
28F008SA-120(5)
Symbol
Parameter
Notes
Min
Max
Min
Max
Min
Max
tAVAV
tRC
Read Cycle Time
85
90
120
ns
tAVQV
tACC
Address to Output Delay
85
90
120
ns
tELQV
tCE
CE
to Output Delay
2
85
90
120
ns
tPHQV
tPWH
RP
High to Output Delay
400
400
400
ns
tGLQV
tOE
OE
to Output Delay
2
40
45
50
ns
tELQX
tLZ
CE
to Output Low Z
3
0
0
0
ns
tEHQZ
tHZ
CE
High to Output High Z
3
55
55
55
ns
tGLQX
tOLZ
OE
to Output Low Z
3
0
0
0
ns
tGHQZ
tDF
OE
High to Output High Z
3
30
30
30
ns
tOH
Output Hold from
3
0
0
0
ns
Addresses CE
or OE
Change Whichever is First
NOTES
1 See AC InputOutput Reference Waveform for timing measurements
2 OE
may be delayed up to tCE–tOE after the falling edge of CE
without impact on tCE
3 Sampled not 100% tested
4 See High Speed AC InputOutput Reference Waveforms and High Speed AC Testing Load Circuits for testing characteris-
tics
5 See AC InputOutput Reference Waveforms and AC Testing Load Circuits for testing characteristics
23



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