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28F008SA Datasheet(PDF) 26 Page - Intel Corporation

Part # 28F008SA
Description  8-MBIT (1-MBIT x 8) FlashFileTM MEMORY
PDF  33 Pages
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Manufacturer  INTEL [Intel Corporation]
Direct Link  http://www.intel.com
Logo INTEL - Intel Corporation

28F008SA Datasheet(HTML) 26 Page - Intel Corporation

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28F008SA
AC CHARACTERISTICSWrite Operations(1)
Versions
VCCg5%
28F008SA-85(7)
Unit
VCCg10%
28F008SA-85(8)
28F008SA-120(8)
Symbol
Parameter
Notes
Min
Max
Min
Max
Min
Max
tAVAV
tWC
Write Cycle Time
85
90
120
ns
tPHWL
tPS
RP
High Recovery to
2
1
1
1
m
s
WE
Going Low
tELWL
tCS
CE
Setup to WE
Going
10
10
10
ns
Low
tWLWH
tWP
WE
Pulse Width
40
40
40
ns
tVPWH
tVPS
VPP Setup to WE
Going
2
100
100
100
ns
High
tAVWH
tAS
Address Setup to WE
340
40
40
ns
Going High
tDVWH
tDS
Data Setup to WE
Going
4
40
40
40
ns
High
tWHDX
tDH
Data Hold from WE
High
5
5
5
ns
tWHAX
tAH
Address Hold from WE
55
5
ns
High
tWHEH
tCH
CE
Hold from WE
High
10
10
10
ns
tWHWL
tWPH
WE
Pulse Width High
30
30
30
ns
tWHRL
WE
High to RYBY
100
100
100
ns
Going Low
tWHQV1
Duration of Byte Write
5 6
6
6
6
m
s
Operation
tWHQV2
Duration of Block Erase
5 6
03
03
03
sec
Operation
tWHGL
Write Recovery before
0
0
0
m
s
Read
tQVVL
tVPH
VPP Hold from Valid SRD
2 6
0
0
0
ns
RYBY
High
NOTES
1 Read timing characteristics during erase and byte write operations are the same as during read-only operations Refer to
AC Characteristics for Read-Only Operations
2 Sampled not 100% tested
3 Refer to Table 3 for valid AIN for byte write or block erasure
4 Refer to Table 3 for valid DIN for byte write or block erasure
5 The on-chip Write State Machine incorporates all byte write and block erase system functions and overhead of standard
Intel flash memory including byte program and verify (byte write) and block precondition precondition verify erase and
erase verify (block erase)
6 Byte write and block erase durations are measured to completion (SR7 e 1 RYBY
e
VOH) VPP should be held at
VPPH until determination of byte writeblock erase success (SR345 e 0)
7 See High Speed AC InputOutput Reference Waveforms and High Speed AC Testing Load Circuits for testing characteris-
tics
8 See AC InputOutput Reference Waveforms and AC Testing Load Circuits for testing characteristics
26



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