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ADuC7122BBCZ Datasheet(PDF) 33 Page - Analog Devices |
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ADuC7122BBCZ Datasheet(HTML) 33 Page - Analog Devices |
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33 / 96 page ![]() Data Sheet ADuC7122 Rev. A | Page 33 of 96 CONVERTER OPERATION The ADC incorporates a successive approximation (SAR) architecture involving a charge-sampled input stage. This architecture is described for the three different modes of operation: differential mode, pseudo differential mode, and single-ended mode. Differential Mode The ADuC7122 contains a successive approximation ADC based on two capacitive DACs. Figure 18 and Figure 19 show simplified schematics of the ADC in acquisition and conversion phase, respectively. The ADC comprises control logic, a SAR, and two capacitive DACs. In Figure 18 (the acquisition phase), SW3 is closed and SW1 and SW2 are in Position A. The comparator is held in a balanced condition, and the sampling capacitor arrays acquire the differential signal on the input. CAPACITIVE DAC CAPACITIVE DAC CONTROL LOGIC COMPARATOR SW3 SW1 A A B B SW2 CS CS VREF CHANNEL+ CHANNEL– ADC0 ADC10 MUX Figure 18. ADC Acquisition Phase When the ADC starts a conversion (see Figure 19), SW3 opens and SW1 and SW2 move to Position B, causing the comparator to become unbalanced. Both inputs are disconnected when the conversion begins. The control logic and the charge redistribution DACs are used to add and subtract fixed amounts of charge from the sampling capacitor arrays to bring the comparator back into a balanced condition. When the comparator is rebalanced, the conversion is complete. The control logic generates the ADC output code. The output impedances of the sources driving the VIN+ and VIN− inputs must be matched; otherwise, the two inputs have different settling times, resulting in errors. The input channel configuration for differential mode is set using the ADCCP and ADCCN registers. CAPACITIVE DAC CAPACITIVE DAC CONTROL LOGIC COMPARATOR SW3 SW1 A A B B SW2 CS CS VREF CHANNEL+ CHANNEL– ADC0 ADC10 MUX Figure 19. ADC Conversion Phase Pseudo Differential Mode In pseudo differential mode, Channel− is linked to the VIN− input of the ADuC7122, and SW2 switches between A (Channel−) and B (VREF). The VIN− input must be connected to ground or a low voltage. The input signal on VIN+ can then vary from VIN− to VREF + VIN−. Note that VIN− must be selected so that VREF + VIN− does not exceed AVDD. In pseudo differential mode, only AINCM or PADCxN should be enabled for the VIN− channel. The ADCCN register is used to set Channel− to AINCM or PADCxN, and the Channel+ can be selected using the ADCCP register. CAPACITIVE DAC CAPACITIVE DAC CONTROL LOGIC COMPARATOR SW3 SW1 A A B B SW2 CS CS VREF ADC0 ADC9 VIN– MUX CHANNEL+ CHANNEL– PADCxP Figure 20. ADC in Pseudo Differential Mode Single-Ended Mode In single-ended mode, SW2 is always connected internally to ground. The VIN− input can be floating. The input signal range on VIN+ is 0 V to VREF. The ADuC7122 has 11 fixed gain ADC channels and two programmable gain ADC channels, which are enabled using the ADCCP register. CAPACITIVE DAC CAPACITIVE DAC CONTROL LOGIC COMPARATOR SW3 SW1 A B CS CS ADC0 ADC10 MUX CHANNEL+ CHANNEL– Figure 21. ADC in Single-Ended Mode Analog Input Structure Figure 22 shows the equivalent circuit of the analog input structure of the ADC. The four diodes provide ESD protection for the analog inputs. Care must be taken to ensure that the analog input signals never exceed the supply rails by more than 300 mV. Voltage in excess of 300 mV can cause these diodes to become forward biased and start conducting into the substrate. These diodes can conduct up to 10 mA without causing irreversi- ble damage to the part. The C1 capacitors in Figure 22 are typically 4 pF and can be primarily attributed to pin capacitance. The resistors are lumped components made up of the on resistance of the switches. The value of these resistors is typically about 100 Ω. The C2 capacitors are the ADC sampling capacitors and have a capacitance of 16 pF typical. |
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