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M21050 Datasheet(PDF) 22 Page - M/A-COM Technology Solutions, Inc. |
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M21050 Datasheet(HTML) 22 Page - M/A-COM Technology Solutions, Inc. |
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22 / 70 page ![]() 14 Mindspeed Technologies™ 21050-DSH-001-F Mindspeed Proprietary and Confidential M21050 Data Sheet 1.1.16 Loss of Activity By default, the LOA detector is enabled and can be disabled by setting CDR_ctrlA_N[1] = 0b, where N is mapped to the CDR (number). Loss of activity measures the transition density of data to determine if the data is valid. During small time intervals, variations are due to data content, packet headers, stress patterns, etc., which is taken into account by averaging over a larger time period. In some applications, when data is not present, noise produces rail- to-rail transitions that cause problems with level based detectors. These applications include cascaded CDRs, high-gain crosspoints, as well as modules with optical amplifiers. As a result, the transition density LOA can sepa- rate data from random noise, determine false lock at the wrong integer and non-integer data-rate, signal stuck high/ low conditions, and determine false lock to re-timed noise. Unlike level based detectors, it cannot determine false lock onto low amplitude data, which is a condition that does not typically occur with backplane applications, and can be handled by the limiting amplifier or pre-amplifier in modules. The LOA window is fixed at 25% to 100%. 1.1.17 Built-in Self Test (BIST) Overview The M21050 contains a single BIST test pattern generator as well as a test pattern receiver. Both the BIST trans- mitter (BIST Tx), and BIST receiver (BIST Rx) are designed to operate with fixed patterns. PRBS 27-1, 215-1, 223- 1, and 231-1 test patterns are provided. For 8b/10b testing, the fibre channel CRPAT and CJTPAT standard patterns are supported. In addition, an 8b/10b countdown pattern is also provided; this is the 8b/10b representation of a binary count from 255 to 0, while maintaining 8b/10b running disparity requirements. User programmable 16 bit and 20 bit patterns are also provided; they are typically used to generate short patterns for debug, such as 1100b, as well as 8b/10b idle or control characters. The BIST is designed to reduce system development time, as well as product test costs, and can be used by both the equipment provider as well as the equipment end user. When enabled, the BIST Rx allows one input from the CDR to enter the BIST receiver. The desired channel to monitor is selected through a control register. The BIST Rx uses the recovered clock and data from the selected CDR to drive the pattern checker. Every time a bit error is received, the error register is incremented. The maxi- mum number of errors is FFh, and all subsequent errors will not be counted. At any time, the error register can be cleared. By keeping track of the time between clear and read, a rough BER number can be obtained. When enabled, the BIST Tx can broadcast the output test pattern to any of the CDR outputs (the BIST Tx and Rx can be used at the same time). The BIST Tx contains an internal clock multiplier (PLL), that can take its input from either the external reference frequency, or from the same CDR that is driving the BIST Rx (only in full rate mode, DRD = 1). Table 1-11. LOL Window Size and Decision Time Examples Condition Nacq Nnarrow Nwide Narrow Window (ppm) Wide Window (ppm) Decision Time (µs) Hardwired mode 101b 0011b 0b ±1465 ±1955 420 Two-wire serial interface mode 101b 0011b 0b ±1465 ±1955 420 iFV = iFR 111b 0010b 1b ±245 ±975 1685 Fast lock 010b 0001b 0b ±5860 ±7800 56 Notes: 1. Decision time is calculated with iFR = 19.44 MHz; will scale proportionally with iFR range from 10 to 25 MHz. 2. Above are examples showing ability to tailor windows for data-rates, reference frequencies, and acquisition times. |
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