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M21050 Datasheet(PDF) 22 Page - M/A-COM Technology Solutions, Inc.

Part # M21050
Description  Duplex Quad Multi-Rate CDR
PDF  70 Pages
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Manufacturer  MA-COM [M/A-COM Technology Solutions, Inc.]
Direct Link  http://www.macomtech.com
Logo MA-COM - M/A-COM Technology Solutions, Inc.

M21050 Datasheet(HTML) 22 Page - M/A-COM Technology Solutions, Inc.

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14
Mindspeed Technologies™
21050-DSH-001-F
Mindspeed Proprietary and Confidential
M21050 Data Sheet
1.1.16
Loss of Activity
By default, the LOA detector is enabled and can be disabled by setting CDR_ctrlA_N[1] = 0b, where N is mapped to
the CDR (number). Loss of activity measures the transition density of data to determine if the data is valid. During
small time intervals, variations are due to data content, packet headers, stress patterns, etc., which is taken into
account by averaging over a larger time period. In some applications, when data is not present, noise produces rail-
to-rail transitions that cause problems with level based detectors. These applications include cascaded CDRs,
high-gain crosspoints, as well as modules with optical amplifiers. As a result, the transition density LOA can sepa-
rate data from random noise, determine false lock at the wrong integer and non-integer data-rate, signal stuck high/
low conditions, and determine false lock to re-timed noise. Unlike level based detectors, it cannot determine false
lock onto low amplitude data, which is a condition that does not typically occur with backplane applications, and
can be handled by the limiting amplifier or pre-amplifier in modules. The LOA window is fixed at 25% to 100%.
1.1.17
Built-in Self Test (BIST) Overview
The M21050 contains a single BIST test pattern generator as well as a test pattern receiver. Both the BIST trans-
mitter (BIST Tx), and BIST receiver (BIST Rx) are designed to operate with fixed patterns. PRBS 27-1, 215-1, 223-
1, and 231-1 test patterns are provided. For 8b/10b testing, the fibre channel CRPAT and CJTPAT standard patterns
are supported. In addition, an 8b/10b countdown pattern is also provided; this is the 8b/10b representation of a
binary count from 255 to 0, while maintaining 8b/10b running disparity requirements. User programmable 16 bit
and 20 bit patterns are also provided; they are typically used to generate short patterns for debug, such as 1100b,
as well as 8b/10b idle or control characters. The BIST is designed to reduce system development time, as well as
product test costs, and can be used by both the equipment provider as well as the equipment end user.
When enabled, the BIST Rx allows one input from the CDR to enter the BIST receiver. The desired channel to
monitor is selected through a control register. The BIST Rx uses the recovered clock and data from the selected
CDR to drive the pattern checker. Every time a bit error is received, the error register is incremented. The maxi-
mum number of errors is FFh, and all subsequent errors will not be counted. At any time, the error register can be
cleared. By keeping track of the time between clear and read, a rough BER number can be obtained.
When enabled, the BIST Tx can broadcast the output test pattern to any of the CDR outputs (the BIST Tx and Rx
can be used at the same time). The BIST Tx contains an internal clock multiplier (PLL), that can take its input from
either the external reference frequency, or from the same CDR that is driving the BIST Rx (only in full rate mode,
DRD = 1).
Table 1-11.
LOL Window Size and Decision Time Examples
Condition
Nacq
Nnarrow
Nwide
Narrow
Window
(ppm)
Wide
Window
(ppm)
Decision
Time
(µs)
Hardwired mode
101b
0011b
0b
±1465
±1955
420
Two-wire serial interface mode
101b
0011b
0b
±1465
±1955
420
iFV = iFR
111b
0010b
1b
±245
±975
1685
Fast lock
010b
0001b
0b
±5860
±7800
56
Notes:
1. Decision time is calculated with iFR = 19.44 MHz; will scale proportionally with iFR range from 10 to 25 MHz.
2. Above are examples showing ability to tailor windows for data-rates, reference frequencies, and acquisition times.



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