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ADS8422IPFBT Datasheet(PDF) 2 Page - Texas Instruments

Part # ADS8422IPFBT
Description  16-BIT, 4-MSPS, PSEUDO-BIPOLAR, FULLY DIFFERENTIAL INPUT, MICROPOWER SAMPLING ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE, REFERENCE
PDF  29 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

ADS8422IPFBT Datasheet(HTML) 2 Page - Texas Instruments

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ABSOLUTE MAXIMUM RATINGS
(1)
ADS8422
SLAS512B – JUNE 2006 – REVISED DECEMBER 2006
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION(1)
MAXIMUM
MAXIMUM
INTEGRAL
NO MISSING CODES
PACKAGE
PACKAGE
TEMPERATURE
ORDERING
TRANSPORT
MODEL
DIFFERENTIAL
LINEARITY
RESOLUTION (BIT)
TYPE
DESIGNATOR
RANGE
INFORMATION
MEDIA QTY.
LINEARITY (LSB)
(LSB)
Small tape and
ADS8422IPFBT
reel 250
9
×9 48-Pin
ADS8422I
±6
±2
15
PFB
–40
°C to 85°C
TQFP
Tape and reel
ADS8422IPFBR
1000
Small tape and
ADS8422IBPFBT
reel 250
9
×9 48-Pin
ADS8422IB
±2
+1.5/-1
16
PFB
–40
°C to 85°C
TQFP
Tape and reel
ADS8422IBPFBR
1000
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
over operating free-air temperature range (unless otherwise noted)
VALUE
UNIT
+IN to AGND
–0.4 to +VA + 0.1
V
–IN to AGND
–0.4 to +VA + 0.1
V
Voltage
+VA to AGND
–0.3 to 7
V
+VBD to BDGND
–0.3 to 7
V
Digital input voltage to BDGND
–0.3 to +VBD + 0.3
V
Digital output voltage to BDGND
–0.3 to +VBD + 0.3
V
TA
Operating free-air temperature range
–40 to 85
°C
Tstg
Storage temperature range
–65 to 150
°C
Junction temperature (TJ max)
150
°C
Power dissipation
(TJMax – TA)/θJA
TQFP 48-pin package
θ
JA thermal impedance
86
°C/W
Vapor phase (60 sec)
215
°C
Lead temperature, soldering
Infrared (15 sec)
220
°C
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2
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