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Temperature under Bias

Storage Temperature

b

All Input or Output Voltage

with Respect to GND

b

Power Dissipation

20 MHz

05W

ESD Rating

2000V

Temperature Cycle

300 of 0125 C

Symbol

Parameter

Conditions

Min

Typ

Max

Units

Logical 1 Input Voltage

Tested with a Limited

20

V

Functional Pattern

Logical 0 Input Voltage

Tested with a Limited

b

05

08

V

Functional Pattern

Q and WE Outputs

V

Q and WE Outputs

05

V

All Outputs except Qs WE

V

All Outputs except Qs WE

05

V

Input Leakage Current

b

10

10

m

A

ML Input Current (Low)

200

m

A

Standby Current

6

15

mA

Standby Current

8

17

mA

Standby Current

10

20

mA

Supply Current

CLK at 12 MHz (Inputs Active)

30

60

mA

Supply Current

CLK at 20 MHz (Inputs Active)

65

90

mA

Supply Current

CLK at 33 MHz (Inputs Active)

115

150

mA

Input Capacitance

10

pF

Note 1

‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed They are not meant to imply that the devices

should be operated at these limits The tables of ‘‘Electrical Characteristics’’ provide conditions for actual device operation

Note 2

Note 3

AC production testing is done at 50 pF

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