5

TLV521

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SNOSD26 – MAY 2016

Product Folder Links: TLV521

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Copyright © 2016, Texas Instruments Incorporated

(1)

Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in

very limited self-heating of the device such that TJ = TA. Parametric performance, as indicated in the electrical tables, is not ensured

under conditions of self heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device

may be permanently degraded, either mechanically or electrically.

(2)

All limits are ensured by testing, statistical analysis or design.

(3)

Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and

will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production

material.

(4)

The EMI Rejection Ratio is defined as EMIRR = 20log (VRF_PEAK/

ΔVOS).

6.6

AC Electrical Characteristics

(1)

PARAMETER

TEST CONDITIONS

MIN

(2)

TYP

(3)

MAX

(2)

UNIT

GBW

Gain-Bandwidth Product

6

kHz

SR

Slew Rate

Falling Edge

2.9

V/ms

Rising Edge

2.5

Phase Margin

73

deg

Gain Margin

19

dB

Input-Referred Voltage Noise Density

f = 100 Hz

300

nV/

√Hz

Input-Referred Voltage Noise

0.1 Hz to 10 Hz

22

Input-Referred Current Noise

f = 100 Hz

100

fA/

√Hz

EMIRR

EMI Rejection Ratio, IN+ and IN

f = 400 MHz

121

dB

f = 900 MHz

121

f = 1800 MHz

124

f = 2400 MHz

142