86115D2 datasheet(26/37 Pages) KEYSIGHT

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26 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet

Software Applications (Continued)

86100D-SIM InfiniiSim-DCA

At higher data rates, the effect of measurement fixtures and

channels is prominent and can be accounted for through the

de-embedding capabilities within Option SIM. You may also view

measurements on live and simulated signals, allowing you to

compare design intent to actual performance.

N1012A OIF CEI compliance and debug

application

The N1012A application lets you fully characterize the ~120

transmitter test parameters (including 28G-VSR), reducing your

test time from hours to minutes. Included are return loss tests

and several utilities to improve your test productivity. Debug

mode enables you to characterize your devices well beyond the

parameters prescribed in the implementation agreements.

N1014A SFF-8431 compliance and debug

application

The N1014A application lets you fully characterize ~70 test

parameters including all transmitter tests for host, module and

host copper and all test signals for receiver testing. Return loss

tests and utilities are also included.

N1019A user-defined application

You may create your own test application or suite of tests using

the DCA-X and other instruments. Quickly and intuitively create

groups of tests, test descriptions, user prompts and test limits.

Use concise HTML reports to share your multiple test results with

your users.

N1081-4A IEEE802.3 Ethernet applications

The extensive requirements for IEEE802.3-2012, 802.3bj and

802.3bm are covered in these four applications, which comprise

> 400 tests. Characterize your device for one, four or ten lanes,

and analyze trends over time/temperature and between devices.

86100D-BFP Automatic Fixture Removal (AFR)

When measuring physical layer devices with non-coaxial

interfaces, test fixtures or probes are often used to connect the

device under test (DUT) to the measurement equipment. For

accurate measurements of the DUT, the fixtures or probes need

to be characterized and their effects removed from the composite

measurement of the DUT plus test fixture or probe combination.

This option adds the Automatic Fixture Removal (AFR) capability

from Keysight’s powerful N1930B Physical Layer Test System

(PLTS) software to help you characterize a fixture or probe with

non-coaxial interfaces. Fixtures and probes to be characterized

can be single-ended or differential.

86115D2 Datasheet(PDF) 26 Page - Keysight Technologies

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