86115D2 datasheet(28/37 Pages) KEYSIGHT

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28 | Keysight | Infiniium DCA-X 86100D Wide-Bandwidth Oscilloscope Mainframe and Modules - Data Sheet

Option 500 productivity package including TDEC

Option 500 enables Rapid Eye acquisition and TDEC (transmitter

dispersion and eye closure) measurements. Rapid Eye achieves

two significant benefits. First, unlike conventional sampling

and data display, when an eye mask test is performed, every

acquired sample will be compared to the mask, as the central

eye is composed of all acquired samples. Effective throughput is

improved at least 60%. Second, incomplete eye diagram displays

that can occur when triggering at sub-rates are eliminated. TDEC

is a complex eye diagram measurement required for new high

data rate standards deployed over multimode fiber. It is easily

and quickly achieved with the automated TDEC measurement.

(IEEE 802.3bm and T11 FC-PI-6P require a specific TDEC channel

bandwidth, achieved with 86105D/86115D-Option 168.)

Option 401 advanced EYE analysis

– Jitter measurements

Total jitter (TJ), random jitter (RJ), deterministic jitter (DJ), J2

jitter (J2), J5 jitter (J5), J9 jitter (J9)

– Amplitude measurements

Total interference (TI), random noise (RN), deterministic

interference (DI), eye opening

– Mask test

Pass/fail status, BER limit

Option SIM InfiniiSim-DCA

2-port de-embedding and embedding; 4-port de-embedding and

embedding; add simulated random jitter and noise

Option 9FP PAM-N analysis software

– Electrical and optical signals

– Eye width, eye height, eye skew

– Level amplitude, level noise, level skew

– Linearity measurements

TDR/TDT mode (requires TDR module)

Some also usable within measurement regions:

Prior to average add:

– Time domain responses available in volts, percent reflection

and ohms (where applicable)

– X-axis in time or distance

– Average

– Min

– Max

– Amplitude at time

– Excess capacitance

– Excess inductance

– Rise time

– Fall time

– Delta time

Measurements (Continued)

– Time at max

– Time at min

– Time at amplitude

– Limit lines

– Time at edge

Additional capabilities

Standard functions

– Standard functions are available through pull down menus

and soft keys, and some functions are also accessible

through the front panel knobs.

Markers

– Two vertical and two horizontal (user-selectable)

Limit tests

– Acquisition limits

– Limit test “Run Until” conditions — Off, # of Waveforms, # of

Samples

– Report action on completion — Save waveform to memory,

save screen image

– Measurement limit test

– Specify number of failures to stop limit test

– When to fail selected measurement — Inside limits, outside

limits, always fail, never fail

– Report action on failure — Save waveform to memory, save

screen image, save summary

– Mask limit test

– Specify number of failed mask test samples

– Report action on failure — Save waveform to memory, save

screen image, save summary

Limit lines

– With the limit line editor, you can modify an existing limit line

or create a new limit line from a current waveform or manual

data entry.

– Limit lines are displayed boundaries used for pass/fail testing

in oscilloscope and TDR/TDT instrument modes, and they

are similar to masks in Eye/Mask mode.

– Any data point that occurs above an upper limit line or below

a lower limit line causes a failed condition. A failed portion of

a waveform that is beyond the limit line boundary is displayed

in red.

Waveform autoscaling

Autoscaling provides quick horizontal and vertical scaling of both

pulse and eye-diagram (RZ and NRZ) waveforms.

Gated triggering

Trigger gating port allows easy external control of data

acquisition for circulating loop or burst-data experiments. Use

TTL-compatible signals to control when the instrument does and

does not acquire data.

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