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MAX8543EEE Datasheet(PDF) 21 Page - Maxim Integrated Products |
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MAX8543EEE Datasheet(HTML) 21 Page - Maxim Integrated Products |
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21 / 27 page ![]() Step-Down Controllers with Prebias Startup, Lossless Sensing, Synchronization, and OVP ______________________________________________________________________________________ 21 MOSFET Selection The MAX8543/MAX8544 drive two or four external, logic-level, n-channel MOSFETs as the circuit switch elements. The key selection parameters are: 1) On-resistance (RDS(ON)): the lower, the better. 2) Maximum drain-to-source voltage (VDSS): should be at least 20% higher than the input supply rail at the high-side MOSFET’s drain. 3) Gate charges (QG, QGD, QGS): the lower, the better. For a 3.3V input application, choose a MOSFET with a rated RDS(ON) at VGS = 2.5V. For a 5V input application, choose the MOSFETs with rated RDS(ON) at VGS ≤ 4.5V. For a good compromise between efficiency and cost, choose the high-side MOSFET (N1, N2) that has conduc- tion losses equal to the switching loss at nominal input voltage and output current. The selected low-side MOSFET (N3, N4) must have an RDS(ON) that satisfies the current-limit-setting condition above. Ensure that the low- side MOSFET does not spuriously turn on due to dV/dt caused by the high-side MOSFET turning on as this would result in shoot-through current and degrade the efficiency. MOSFETs with a lower QGD / QGS ratio have higher immunity to dV/dt. For high-current applications, it is often preferable to parallel two MOSFETs rather than to use a single large MOSFET. For proper thermal-management design, the power dis- sipation must be calculated at the desired maximum operating junction temperature, maximum output current, and worst-case input voltage (for the low-side MOSFET, worst case is at VIN(MAX); for the high-side MOSFET, it could be either at VIN(MAX) or VIN(MIN)). The high-side and low-side MOSFETs have different loss components due to the circuit operation. The low-side MOSFET oper- ates as a zero-voltage switch; therefore, major losses are the channel-conduction loss (PLSCC) and the body- diode conduction loss (PLSDC): Use RDS(ON) at TJ(MAX): where VF is the body-diode forward-voltage drop, tDT is the dead time between high-side and low-side switching transitions, and fS is the switching frequency. The high-side MOSFET operates as a duty-cycle control switch and has the following major losses: the channel- conduction loss (PHSCC), the VI overlapping switching loss (PHSSW), and the drive loss (PHSDR). The high-side MOSFET does not have body-diode conduction loss because the diode never conducts current: Use RDS(ON) at TJ(MAX): where IGATE is the average DH-driver output current capability determined by: where RDS(ON)(HS) is the high-side MOSFET driver’s on-resistance (1 Ω, typ) and RGATE is the internal gate resistance of the MOSFET ( ≈0.5Ω to 3Ω): where VGS ≈ VVL. In addition to the losses above, allow about 20% more for additional losses due to MOSFET output capacitances and low-side MOSFET body-diode reverse-recovery charge dissipated in the high-side MOSFET, but it is not well defined in the MOSFET data sheet. Refer to the MOSFET data sheet for thermal resistance specifications to calculate the PC board area needed to maintain the desired maximum operating junction temperature with the above calculated power dissipations. To reduce EMI caused by switching noise, add a 0.1µF ceramic capacitor from the high-side switch drain to the low-side switch source or add resistors in series with DH and DL to slow down the switching transitions. However, adding series resistors increases the power dissipation of the MOSFET, so be sure this does not overheat the MOSFET. PQ V f R RR HSDR G GS S GATE GATE DS ON HS =× × × + ()( ) I V RR GATE VL DS ON HS GATE ≅ × + 05 . ()( ) PV I QQ I f HSSW IN LOAD GS GD GATE S =× × + × P V V IR HSCC OUT IN LOAD DS ON =× × () 2 PI V t f LSDC LOAD F DT S =× × × × 2 P V V IR LSCC OUT IN LOAD DS ON =− ⎛ ⎝⎜ ⎞ ⎠⎟ ×× 1 2 () |
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