AD9671EBZ datasheet(54/61 Pages) AD

54 / 61 page

Data Sheet

AD9675

Rev. A | Page 53 of 60

Addr.

(Hex)

Name

Bit 7

(MSB)

Bit 6

Bit 5

Bit 4

Bit 3

Bit 2

Bit 1

Bit 0

(LSB)

Default

Value

Comments

0x115

CHIP_

ADDR_EN

Chip

address

mode

0 = disable

(default)

1 = enable

Chip address qualifier

0 0000 (default)

(If read, returns the state of ADDR0 to ADRR4 pins)

0x00

Chip address

mode en-

ables the

addressing of

devices if the

value of chip

address

qualifier

equals the

state on the

address pins,

ADDRx

(global)

0x116

ANALOG_

TEST_

TONE

Analog test tone

amplitude

See Table 23 to

Table 25

Analog test tone

frequency

00 = fSAMPLE/4 (default)

01 = fSAMPLE/8

10 = fSAMPLE/16

11 = fSAMPLE/32

0x00

Analog test

tone

amplitude

and

frequency

(global)

0x117

DIG_

SINE_

TEST_

FREQ

Digital test tone frequency

0 0000 = 1 × fSAMPLE/64

0 0001 = 2 × fSAMPLE/64

…

1 1111 = 32 × fSAMPLE/64

0x00

Digital sine

test tone

frequency

(global)

0x118

DIG_

SINE_

TEST_

AMP

Digital test tone amplitude

0000 = AFULL-SCALE (default)

0001 = AFULL-SCALE/2

0010 = AFULL-SCALE/22

…

1111 = AFULL-SCALE/215

0x00

Digital sine

test tone

amplitude

(global)

0x119

DIG_

SINE_

TEST_

OFFSET

Offset multiplier (a)

0 1111 = 15

0 1110 = 14

…

0 0000 = 0 (default)

1 1111 = −1

…

1 0000 = −16

Offset exponent (b)

000 = 0 (default)

001 = 1

…

111 = 7

0x00

Digital sine

test tone

offset

(global)

Offset = AFULL-SCALE × a × 2−(13 − b)

Offset range is ~0.5 dB

Maximum positive offset = 15 × 2−(13 − 7) = 0.25 × AFULL-SCALE

Maximum negative offset = −16 × 2−(13 − 7) ≈ −0.25 × AFULL-SCALE

0x11A

TEST_

MODE_

CHENABLE

Ch H

enable

0 = off

(default)

1 = on

Ch G

enable

0 = off

(default)

1 = on

Ch F

enable

0 = off

(default)

1 = on

Ch E

enable

0 = off

(default)

1 = on

Ch D

enable

0 = off

(default)

1 = on

Ch C

enable

0 = off

(default)

1 = on

Ch B

enable

0 = off

(default)

1 = on

Ch A

enable

0 = off

(default)

1 = on

0x00

Enable

channels for

test mode

(global)

0x11B

TEST_

MODE_

CONFIG

Data path test mode selection

000 = disable test modes (default)

001 = enable digital sine test mode

010 = reserved

011 = enable channel ID test mode

(16-bit data = digital ramp (7 bits) +

reserved bit (0) + Channel ID (3 bits) +

Chip Address (5 bits)

100 = enable analog test tone

101 = reserved

…

111 = reserved

0x00

Enable

digital test

modes

(local)

0x11C

RESERVED_

11C

0x00

Reserved

0x11D

RESERVED_

11D

0x00

Reserved

AD9671EBZ Datasheet(PDF) 54 Page - Analog Devices

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