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RT5713 Datasheet(PDF) 8 Page - Richtek Technology Corporation |
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RT5713 Datasheet(HTML) 8 Page - Richtek Technology Corporation |
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8 / 25 page ![]() RT5713/14 Copyright © 2023 Richtek Technology Corporation. All rights reserved. is a registered trademark of Richtek Technology Corporation. www.richtek.com DS5713/14-03 March 2023 8 Parameter Symbol Test Conditions Min Typ Max Unit UGATE RON RON_UG IOUT = 50mA -- 300 -- m LGATE RON RON_LG IOUT = 50mA -- 170 -- m Output Discharge Resistor RDIS EN = GND, IOUT = −10mA -- 10 -- VOUT Pin Input Leakage IVOUT VOUT = 1.8V, EN = VIN -- 100 -- nA VOUT Minimum Off Time tOFF_MIN -- 80 -- ns Line Regulation VOUT_LineReg VOUT = 1.8V, IOUT = 100mA, VIN = 2.2V to 5.5V -- 1 -- % Load Regulation VOUT_LoadReg VOUT = 1.8V, including PFM operation -- 2 -- % Over-Temperature Protection TOTP -- 150 -- °C Over-Temperature Protection Hysteresis TOTP_HYS -- 20 -- °C Timing Regulator Start Up Delay Time tSS_EN IOUT = 0mA, EN = GND to VIN, VOUT starts rising -- 0.1 -- ms Regulator Soft-Start Time tSS VOUT = 1.8V, IOUT = 10mA, EN = VIN -- 0.7 -- ms Logic Input (EN and VSEL) Input High Threshold VIH VIN = 2.2V to 5.5V 1.2 -- -- V Input Low Threshold VIL VIN = 2.2V to 5.5V -- -- 0.4 V Input Pin Bias Current IIN -- 10 -- nA Note 1. Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may affect device reliability. Note 2. JA is measured under natural convection (still air) at TA = 25°C with the component mounted on a high effective-thermal- conductivity four-layer test board on a JEDEC 51-7 thermal measurement standard. JC is measured at the case top of the package. Note 3. Devices are ESD sensitive. Handling precautions are recommended. Note 4. The device is not guaranteed to function outside its operating conditions. |
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