TLE5010 datasheet(45/56 Pages) INFINEON

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TLE5010

Test Structures

Draft

Preliminary Data Sheet

V 0.9, 2007-05

Test Structures

Two different test signal structures are implemented in the TLE5010. These are:

• Functional angle test. In this case, well-knows signals feed the ADCs.

• Temperature measurement. This is useful to read out the chip temperature for

compensation purposes.

11.1

Functional Angle Tests

It is possible to feed the ADCs with appropriate values to simulate a certain magnet-

position and other GMR effects.

The values are generated with resistors on the chip.

Following X / Y ADC values can be programmed:

• 4 points, circle amplitude = 70.7%

(0°, 90°, 180°, 270°)

• 8 points, circle amplitude = 100.0%

(0°, 45°, 90°, 135°,180°, 225°, 270°, 315°)

• 8 points, circle amplitude = 122.1%

(35.3°, 54.7°, 125.3°, 144.7°, 215.3°, 234.7°, 305.3°, 324.7°)

• 4 points, circle amplitude = 141.4%

(45°, 135°, 225°, 315°)

Note: The 100% values correspond to typically 21700 digits and a voltage of ~ 110 mV.

Table 17

Functional Angle Test

X / Y Values (decimal)

min.

typ.

max.

000

-400

400

001

14800

15500

16200

010

20700

21700

22700

011

32767

100 1)

Not allowed to use.

-400

400

101

-14800

-15500

-16200

110

-20700

-21700

-22700

111

-32768

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