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TLE5010 Datasheet(PDF) 46 Page - Infineon Technologies AG |
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TLE5010 Datasheet(HTML) 46 Page - Infineon Technologies AG |
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46 / 56 page ![]() TLE5010 Test Structures Draft Preliminary Data Sheet 46 V 0.9, 2007-05 ADC Test Vectors Figure 14 ADC Test Vectors 11.2 Temperature Measurement An internal bandgap voltage can be used to measure the temperature on the chip. This may be used to compensate temperature dependent errors. The temperature value is sent out instead of the X value. Table 18 Temperature Measurement Parameter Symbol Limit Values Unit Notes min. typ. max. Value at -40°C T-40 - - +22000 digits Value at 25°C T25 +2550 +5775 +9000 digits Value at 150°C T150 -22000 - - digits Temperature Sensitivity ST - -188.75 - dig / K 1) 1) Should be used for temperature compensation of offset errors X Y 0% 122.1% 100.0% 70.7% 141.4% |
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