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LC320DXE Datasheet(PDF) 23 Page - LG Semicon Co.,Ltd. |
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LC320DXE Datasheet(HTML) 23 Page - LG Semicon Co.,Ltd. |
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23 / 35 page ![]() Product Specification LC320DXE Ver. 1.2 23 / 35 6. Reliability Table 13. ENVIRONMENT TEST CONDITION notes : Before and after Reliability test, LCM should be operated with normal function. No. Test Item Condition 1 High temperature storage test Ta= 60°C 240h 2 Low temperature storage test Ta= -20°C 240h 3 High temperature operation test Ta= 50°C 50%RH 240h 4 Low temperature operation test Ta= 0°C 240h 5 Vibration test (non-operating) Wave form : random Vibration level : 1.0Grms Bandwidth : 10-300Hz Duration : X,Y,Z, Each direction per 10 min 6 Shock test (non-operating) Shock level : 50Grms Waveform : half sine wave, 11ms Direction : ± X, ±Y, ±Z One time each direction 7 Humidity condition Operation Ta= 40 °C ,90%RH 8 Altitude operating storage / shipment 0 - 16,400 ft 0 - 40,000 ft |
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