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MCF52235 Datasheet(PDF) 30 Page - Freescale Semiconductor, Inc |
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MCF52235 Datasheet(HTML) 30 Page - Freescale Semiconductor, Inc |
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30 / 54 page ![]() MCF52235 ColdFire Microcontroller Data Sheet, Rev. 7 Electrical Characteristics Freescale Semiconductor 30 Table 20. Thermal Characteristics Characteristic Symbol Package1 1 The use of this device in one- or two-layer board designs is not recommended due to the limited thermal conductance provided by those boards. Value Unit Junction to ambient, natural convection θ JA 80-pin LQFP, four-layer board 36.02,3 2 θ JMA and Ψjt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Freescale recommends the use of θ JMA and power dissipation specifications in the system design to prevent device junction temperatures from exceeding the rated specification. System designers should be aware that device junction temperatures can be significantly influenced by board layout and surrounding devices. Conformance to the device junction temperature specification can be verified by physical measurement in the customer’s system using the Ψ jt parameter, the device power dissipation, and the method described in EIA/JESD Standard 51-2. 3 Per JEDEC JESD51-6 with the board horizontal. °C/W 112-pin LQFP, four-layer board 35.0 121 MAPBGA, four-layer board 32 80-pin LQFP, one-layer board1 49.01 121 MAPBGA, one-layer board1 561 112-pin LQFP, one-layer board1 44.01 Junction to ambient (@200 ft/min) θ JMA 80-pin LQFP, four-layer board 30.0 °C/W 112-pin LQFP, four-layer board 29.0 121 MAPBGA, four-layer board 28 80-pin LQFP, one-layer board1 39.01 112-pin LQFP, one-layer board1 35.01 121 MAPBGA, one-layer board1 461 Junction to board θ JB 80-pin LQFP 22.04 4 Thermal resistance between the die and the printed circuit board in conformance with JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. °C/W 112-pin LQFP 23.0 121 MAPBGA, four-layer board 18 Junction to case θ JC 80-pin LQFP 6.05 5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). °C/W 112-pin LQFP 6.0 121 MAPBGA 10 Junction to top of package, natural convection Ψ jt 80-pin LQFP 2.06 6 Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written in conformance with Psi-JT. °C/W 112-pin LQFP 2.06 121 MAPBGA 2.06 Maximum operating junction temperature Tj All 130 oC |
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