TLV987

3-V 10-BIT 27 MSPS AREA CCD SENSOR

SIGNAL PROCESSOR

SLAS211A – MARCH 1999 – REVISED SEPTEMBER 1999

5

POST OFFICE BOX 655303

electrical characteristics over recommended operating free-air temperature range,

total device

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

AICC

Analog operating supply current

66

mA

DICC

Digital operation supply current

1

mA

Device power consumption

200

mW

Power consumption in power-down mode

2

mW

DNL

Full channel differential nonlinearity

–1

±0.6

1.5

LSB

INL

Full channel integral nonlinearity

±2

LSB

analog-to-digital converter (ADC)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

ADC resolution

10

Bits

Full-scale input span

2

VPP

Conversion rate

27

MHz

ADC output latency

4.5

CLK

cycles

No missing codes

Assured

correlated double sampler (CDS) and programmable gain amplifier (PGA)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

CDS and PGA sample rate

27

MHz

CDS full-scale input span

Single-ended input

1

V

Input capacitance of CDS

4

pF

Minimum PGA gain

0

1

dB

Maximum PGA gain

35

36

37

dB

PGA gain resolution

0.09

dB

PGA programming code resolution

8-bit monotonic gain control

9

Bits

internal digital-to-analog converters (DAC) for offset correction

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

DAC resolution

8

Bits

INL

Integral nonlinearity

±0.6

±1.2

LSB

DNL

Differential nonlinearity

±0.5

±.99

LSB

Output settling time

To 1% accuracy

80

ns

user digital-to-analog converters (DAC)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

DAC resolution

8

Bits

INL

Integral nonlinearity

±0.5

±1.2

LSB

DNL

Differential nonlinearity

±0.5

±.99

LSB

Output voltage

0

AVDD

V

Output settling time

10-pF external load,

Settle to 1 mV

4

µs