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TLV987 Datasheet(PDF) 3 Page - Texas Instruments |
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TLV987 Datasheet(HTML) 3 Page - Texas Instruments |
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3 / 20 page ![]() TLV987 3-V 10-BIT 27 MSPS AREA CCD SENSOR SIGNAL PROCESSOR SLAS211A – MARCH 1999 – REVISED SEPTEMBER 1999 3 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 Terminal Functions TERMINAL I/O DESCRIPTION NAME NO. I/O DESCRIPTION ADCCLK 25 I ADC clock input. AGND1 44 Analog ground for internal CDS circuits AGND2 4 Analog ground for internal PGA circuits AGND3 20 Analog ground for internal DAC circuits AGND4 32 Analog ground for internal ADC circuits AGND5 37 Analog ground for internal REF circuits AVDD1 43 Analog supply voltage for internal CDS circuits, 3 V AVDD2 3 Analog supply voltage for internal PGA circuits, 3 V AVDD3 19 Analog supply voltage for internal DAC circuits, 3 V AVDD4 33 Analog supply voltage for internal ADC circuits, 3 V AVDD5 41 Analog supply voltage for internal ADC circuits, 3 V BLKG 36 I Control input. CDS operation is disabled when BLKG is pulled low. CLAMP 47 I CCD signal clamp control input CLREF 48 O Clamp reference voltage output. CS 28 I Chip select. A logic low on this input enables the TLV987. DACO1 21 O Digital-to-analog converter output1 DACO2 22 O Digital-to-analog converter output2 DACT 23 O MUXed test output for internal offset DACs DGND 5 Digital ground DIGND 18 Digital interface circuit ground DIN 1 I Input signal from CCD DIVDD 17 Digital interface circuit supply voltage, 1.8 V to 4.4 V DVDD 6 Digital supply voltage, 3 V D0 – D9 7 – 16 O 10-bit three-state ADC output data or offset DACs test data OBCLP 31 I Optical black level and offset calibration control input. Active low. OE 24 I Output data enable. Active low. PIN 2 I Input signal from CCD RBD 38 O Internal bandgap reference for external decoupling RMD 39 O Ref– output for external decoupling RPD 40 O Ref+ output for external decoupling RESET 29 I Hardware reset input, active low. This signal forces a reset of all internal registers. SCLK 26 I Serial clock input. This clock synchronizes the serial data transfer. SDIN 27 I Serial data input to configure the internal registers. SR 45 I CCD reference level sample clock input STBY 30 I Hardware power-down control input, active low SV 46 I CCD signal level sample clock input TPM 34 O MUXed test output: PGA noninverting output or inverted PGA clock TPP 35 O MUXed test output: PGA inverting output or inverted CDS clock VSS 42 Silicon substrate, normally connected to analog ground |
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