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DSP56303 Datasheet(PDF) 41 Page - Freescale Semiconductor, Inc |
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DSP56303 Datasheet(HTML) 41 Page - Freescale Semiconductor, Inc |
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41 / 108 page ![]() AC Electrical Characteristics DSP56303 Technical Data, Rev. 11 Freescale Semiconductor 2-21 Table 2-12. DRAM Out-of-Page and Refresh Timings, Fifteen Wait States1,2 No. Characteristics Symbol Expression3 100 MHz Unit Min Max 157 Random read or write cycle time tRC 16 × T C 160.0 — ns 158 RAS assertion to data valid (read) tRAC 8.25 × TC −5.7 — 76.8 ns 159 CAS assertion to data valid (read) tCAC 4.75 × TC −5.7 — 41.8 ns 160 Column address valid to data valid (read) tAA 5.5 × T C −5.7 — 49.3 ns 161 CAS deassertion to data not valid (read hold time) tOFF 0.0 0.0 — ns 162 RAS deassertion to RAS assertion tRP 6.25 × TC −4.0 58.5 — ns 163 RAS assertion pulse width tRAS 9.75 × T C −4.0 93.5 — ns 164 CAS assertion to RAS deassertion tRSH 6.25 × TC −4.0 58.5 — ns 165 RAS assertion to CAS deassertion tCSH 8.25 × TC −4.0 78.5 — ns 166 CAS assertion pulse width tCAS 4.75 × T C −4.0 43.5 — ns 167 RAS assertion to CAS assertion tRCD 3.5 × TC ± 233.0 37.0 ns 168 RAS assertion to column address valid tRAD 2.75 × TC ± 225.5 29.5 ns 169 CAS deassertion to RAS assertion tCRP 7.75 × T C −4.0 73.5 — ns 170 CAS deassertion pulse width tCP 6.25 × TC – 6.0 56.5 — ns 171 Row address valid to RAS assertion tASR 6.25 × TC −4.0 58.5 — ns 172 RAS assertion to row address not valid tRAH 2.75 × T C −4.0 23.5 — ns 173 Column address valid to CAS assertion tASC 0.75 × TC −4.0 3.5 — ns 174 CAS assertion to column address not valid tCAH 6.25 × TC −4.0 58.5 — ns 175 RAS assertion to column address not valid tAR 9.75 × T C −4.0 93.5 — ns 176 Column address valid to RAS deassertion tRAL 7 × TC −4.0 66.0 — ns 177 WR deassertion to CAS assertion tRCS 5 × TC −3.8 46.2 — ns 178 CAS deassertion to WR4 assertion tRCH 1.75 × T C – 3.7 13.8 — ns 179 RAS deassertion to WR 4 assertion tRRH 0.25 × TC −2.0 0.5 — ns 180 CAS assertion to WR deassertion tWCH 6 × TC −4.2 55.8 — ns 181 RAS assertion to WR deassertion tWCR 9.5 × T C −4.2 90.8 — ns 182 WR assertion pulse width tWP 15.5 × TC −4.5 150.5 — ns 183 WR assertion to RAS deassertion tRWL 15.75 × TC −4.3 153.2 — ns 184 WR assertion to CAS deassertion tCWL 14.25 × T C −4.3 138.2 — ns 185 Data valid to CAS assertion (write) tDS 8.75 × TC −4.0 83.5 — ns 186 CAS assertion to data not valid (write) tDH 6.25 × TC −4.0 58.5 — ns 187 RAS assertion to data not valid (write) tDHR 9.75 × T C −4.0 93.5 — ns 188 WR assertion to CAS assertion tWCS 9.5 × TC −4.3 90.7 — ns 189 CAS assertion to RAS assertion (refresh) tCSR 1.5 × TC −4.0 11.0 — ns 190 RAS deassertion to CAS assertion (refresh) tRPC 4.75 × T C −4.0 43.5 — ns 191 RD assertion to RAS deassertion tROH 15.5 × TC −4.0 151.0 — ns 192 RD assertion to data valid tGA 14 × TC −5.7 — 134.3 ns 193 RD deassertion to data not valid5 tGZ 0.0 — ns 194 WR assertion to data active 0.75 × TC – 1.5 6.0 — ns 195 WR deassertion to data high impedance 0.25 × TC —2.5 ns Notes: 1. The number of wait states for an out-of-page access is specified in the DRAM Control Register. 2. The refresh period is specified in the DRAM Control Register. 3. Use the expression to compute the maximum or minimum value listed (or both if the expression includes ±) . 4. Either tRCH or tRRH must be satisfied for read cycles. 5. RD deassertion always occurs after CAS deassertion; therefore, the restricted timing is tOFF and not tGZ. |
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