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CC430F613 Datasheet(PDF) 84 Page - Texas Instruments |
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CC430F613 Datasheet(HTML) 84 Page - Texas Instruments |
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84 / 120 page ![]() ECCN 5E002 TSPA - Technology / Software Publicly Available CC430F613x CC430F612x CC430F513x SLAS554E – MAY 2009 – REVISED NOVEMBER 2010 www.ti.com Frequency Synthesizer Characteristics TA = 25°C, VCC = 3 V (unless otherwise noted) (1) MIN figures are given using a 27MHz crystal. TYP and MAX figures are given using a 26MHz crystal. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Programmed frequency resolution(2) 26- to 27-MHz crystal 397 fXOSC/2 16 412 Hz Synthesizer frequency tolerance(3) ±40 ppm 50-kHz offset from carrier –95 100-kHz offset from carrier –94 200-kHz offset from carrier –94 500-kHz offset from carrier –98 RF carrier phase noise dBc/Hz 1-MHz offset from carrier –107 2-MHz offset from carrier –112 5-MHz offset from carrier –118 10-MHz offset from carrier –129 PLL turn-on / hop time(4) Crystal oscillator running 85.1 88.4 88.4 µs PLL RX/TX settling time(5) 9.3 9.6 9.6 µs PLL TX/RX settling time(6) 20.7 21.5 21.5 µs PLL calibration time(7) 694 721 721 µs (1) All measurement results are obtained using the EM430F6137RF900 with BOM according to tested frequency range (see Table 46). (2) The resolution (in Hz) is equal for all frequency bands. (3) Depends on crystal used. Required accuracy (including temperature and aging) depends on frequency band and channel bandwidth / spacing. (4) Time from leaving the IDLE state until arriving in the RX, FSTXON, or TX state, when not performing calibration. (5) Settling time for the 1-IF frequency step from RX to TX (6) Settling time for the 1-IF frequency step from TX to RX (7) Calibration can be initiated manually or automatically before entering or after leaving RX/TX. 84 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated |
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